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Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 4, 页码: 997-1004
Authors:  Chen, ZJ (Chen, Zhuojun);  Ding, D (Ding, Ding);  Dong, YM (Dong, Yemin);  Shan, Y (Shan, Yi);  Zhou, SX (Zhou, Shuxing);  Hu, YY (Hu, Yuanyuan);  Zheng, YL (Zheng, Yunlong);  Peng, C (Peng, Chao);  Chen, RM (Chen, Rongmei)
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Phase-locked Loop (Pll)  Phase Noise  Reference Spur  Total Ionizing Dose (Tid)  
Growth and electrical properties of high-quality InGaAsBi thin films using gas source molecular beam epitaxy 期刊论文
JAPANESE JOURNAL OF APPLIED PHYSICS, 2017, 卷号: 56, 期号: 3, 页码: 1-5
Authors:  Zhou, SX (Zhou, Shuxing);  Qi, M (Qi, Ming);  Ai, LK (Ai, Likun);  Wang, SM (Wang, Shumin);  Xu, AH (Xu, Anhuai);  Guo, Q (Guo, Qi)
Adobe PDF(741Kb)  |  Favorite  |  View/Download:77/1  |  Submit date:2017/05/19