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gamma-Ray Radiation Effects on an HfO2-Based Resistive Memory Device 期刊论文
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2018, 卷号: 17, 期号: 1, 页码: 61-64
Authors:  Hu, SG (Hu, Shaogang);  Liu, Y (Liu, Yang);  Chen, TP (Chen, Tupei);  Guo, Q (Guo, Qi);  Li, YD (Li, Yu-Dong);  Zhang, XY (Zhang, Xing-Yao);  Deng, LJ (Deng, L. J.);  Yu, Q (Yu, Qi);  Yin, Y (Yin, You);  Hosaka, S (Hosaka, Sumio)
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Gamma-ray  Hafnium Oxide  Radiation  Resistive Switching  Total Ionizing Dose  
Total ionizing dose and synergistic effects of magnetoresistive random-access memory 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2018, 卷号: 29, 期号: 8, 页码: 1-5
Authors:  Zhang, XY (Zhang, Xing-Yao);  Guo, Q (Guo, Qi);  Li, YD (Li, Yu-Dong);  Wen, L (Wen, Lin);  Zhang, XY
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Magnetoresistive Random-access Memory Total Ionizing Dose  Synergistic Effect  
不同注量率质子辐照对CCD参数退化的影响分析 期刊论文
现代应用物理, 2018, 卷号: 9, 期号: 2, 页码: 67-70
Authors:  李豫东;  文林;  郭旗;  何承发;  周东;  冯婕;  张兴尧;  于新
Adobe PDF(727Kb)  |  Favorite  |  View/Download:38/0  |  Submit date:2018/07/24
质子  电荷耦合器件  辐射效应  注量率  缺陷  
DRMDA: deep representations-based miRNA-disease association prediction 期刊论文
JOURNAL OF CELLULAR AND MOLECULAR MEDICINE, 2018, 卷号: 22, 期号: 1, 页码: 472-485
Authors:  Chen, X (Chen, Xing);  Gong, Y (Gong, Yao);  Zhang, DH (Zhang, De-Hong);  You, ZH (You, Zhu-Hong);  Li, ZW (Li, Zheng-Wei)
Adobe PDF(541Kb)  |  Favorite  |  View/Download:45/0  |  Submit date:2018/01/19
Mirna  Disease  Mirna-disease Association  Deep Representation  Auto-encoder  
基于X射线的晶圆级器件辐照与辐射效应参数提取设备的设计与实现 期刊论文
发光学报, 2017, 卷号: 38, 期号: 6, 页码: 828-834
Authors:  荀明珠;  李豫东;  郭旗;  何承发;  于新;  于钢;  文林;  张兴尧
Adobe PDF(1843Kb)  |  Favorite  |  View/Download:97/0  |  Submit date:2017/08/01
抗辐射加固  试验装置  晶圆级器件  X射线辐照  辐射效应  参数提取  
Characteristics of p-i-n diodes basing on displacement damage detector 期刊论文
RADIATION PHYSICS AND CHEMISTRY, 2017, 卷号: 139, 期号: 10, 页码: 11-16
Authors:  Sun, J (Sun Jing)[ 1,2 ];  Guo, Q (Guo Qi)[ 1 ];  Yu, X (Yu Xin)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1 ];  Shi, WL (Shi Wei-Lei)[ 1 ];  Zhang, XY (Zhang Xing-Yao)[ 1 ]
Adobe PDF(558Kb)  |  Favorite  |  View/Download:16/0  |  Submit date:2019/07/10
Displacement damage  NIEL  P-i-n photodiode  Damage enhancement factor  
Total ionizing dose radiation effects in foue-transistor complementary metal oxide semiconductor image sensors 期刊论文
ACTA PHYSICA SINICA, 2016, 卷号: 65, 期号: 2, 页码: 180-185
Authors:  Wang, F (Wang Fan);  Li, YD (Li Yu-Dong);  Guo, Q (Guo Qi);  Wang, B (Wang Bo);  Zhang, XY (Zhang Xing-Yao);  Wen, L (Wen Lin);  He, CF (He Cheng-Fa)
Adobe PDF(455Kb)  |  Favorite  |  View/Download:85/0  |  Submit date:2016/12/13
Complementary Metal Oxide Semiconductor Image Sensor  Total Ionizing Dose Radiation Effect  Pinned Photodiode  Full Well Chargecapacity  
基于4晶体管像素结构的互补金属氧化物半导体图像传感器总剂量辐射效应研究 期刊论文
物理学报, 2016, 卷号: 65, 期号: 2, 页码: 180-185
Authors:  王帆;  李豫东;  郭旗;  汪波;  张兴尧;  文林;  何承发
Adobe PDF(590Kb)  |  Favorite  |  View/Download:155/0  |  Submit date:2016/03/01
互补金属氧化物半导体图像传感器  电离总剂量效应  钳位二极管  满阱容量  
温度对4管像素结构CMOS图像传感器性能参数的影响 期刊论文
发光学报, 2016, 卷号: 37, 期号: 3, 页码: 332-337
Authors:  王帆;  李豫东;  郭旗;  汪波;  张兴尧
Adobe PDF(377Kb)  |  Favorite  |  View/Download:138/0  |  Submit date:2016/06/02
Cmos图像传感器  转换增益  满阱容量  暗电流  温度  
新型非易失存储器电离辐射效应及机理研究 学位论文
博士, 北京: 中国科学院大学, 2014
Authors:  张兴尧
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新型非易失存储器  传统非易失存储器  总剂量效应  辐射敏感参数