Browse/Search Results:  1-1 of 1 Help

Selected(0)Clear Items/Page:    Sort:
Use the subthreshold-current technique to separate radiation induced defects in gate controlled lateral pnp bipolar transistors 期刊论文
ACTA PHYSICA SINICA, 2012, 卷号: 61, 期号: 7
Authors:  Xi Shan-Bin;  Lu Wu;  Wang Zhi-Kuan;  Ren Di-Yuan;  Zhou Dong;  Wen Lin;  Sun Jing
Adobe PDF(1061Kb)  |  Favorite  |  View/Download:227/5  |  Submit date:2012/11/29
Subthreshold-current Technique  Gate Control  Lateral Pnp Bipolar Transistor  Charge Separation