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Use the subthreshold-current technique to separate radiation induced defects in gate controlled lateral pnp bipolar transistors 期刊论文
ACTA PHYSICA SINICA, 2012, 卷号: 61, 期号: 7
Authors:  Xi Shan-Bin;  Lu Wu;  Wang Zhi-Kuan;  Ren Di-Yuan;  Zhou Dong;  Wen Lin;  Sun Jing
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Subthreshold-current Technique  Gate Control  Lateral Pnp Bipolar Transistor  Charge Separation