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Electron-induced damage to NPN transistors under different fluxes 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2008, 卷号: 19, 期号: 6, 页码: 333-336
Authors:  Zheng Yuzhan;  Lu Wu;  Ren Diyuan;  Guo Qi;  Yu Xuefeng;  Lue Xiaolong;  Lu, W
Adobe PDF(202Kb)  |  Favorite  |  View/Download:117/0  |  Submit date:2014/11/11
Electron Flux  Npn Transistor  Radiation Damage