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深亚微米CMOS图像传感器像素单元累积辐射效应研究 学位论文
博士, 北京: 中国科学院大学, 2019
Authors:  马林东
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CMOS图像传感器  总剂量效应  位移效应  
3MeV质子辐照下背照式CMOS图像传感器固定模式噪声的退化行为 期刊论文
现代应用物理, 2019, 卷号: 10, 期号: 1, 页码: 50-53
Authors:  张翔;  李豫东;  郭旗;  文林;  周东;  冯婕;  马林东;  蔡毓龙;  王志铭
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背照式CMOS图像传感器  3MeV质子  固定模式噪声  位移效应  电离总剂量效应  
γ辐照下4T CMOS有源像素传感器的满阱容量退化机理 期刊论文
现代应用物理, 2019, 卷号: 10, 期号: 1, 页码: 64-68
Authors:  蔡毓龙;  李豫东;  郭旗;  文林;  周东;  冯婕;  马林东;  张翔
Adobe PDF(326Kb)  |  Favorite  |  View/Download:21/0  |  Submit date:2019/05/09
图像传感器  CMOS  满阱容量  电离总剂量效应  
Heavy ion-induced single event effects in active pixel sensor array 期刊论文
SOLID-STATE ELECTRONICS, 2019, 卷号: 152, 期号: 2, 页码: 93-99
Authors:  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Ma, LD (Ma, Lin-Dong)[ 1,2,3 ];  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Wang, TH (Wang, Tian-Hui)[ 1,2,3 ]
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CMOS active pixel sensor (APS)  SEE  Heavy ion  
Electron-beam-irradiation-induced crystallization of amorphous solid phase change materials 期刊论文
JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 卷号: 57, 期号: 4, 页码: 1-4
Authors:  Zhou, D (Zhou, Dong);  Wu, LC (Wu, Liangcai);  Wen, L (Wen, Lin);  Ma, LY (Ma, Liya);  Zhang, XY (Zhang, Xingyao);  Li, YD (Li, Yudong);  Guo, Q (Guo, Qi);  Song, ZT (Song, Zhitang)
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Radiation Effects Due to 3 MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors 期刊论文
CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 7, 页码: 1-4
Authors:  Zhang, X (Zhang, Xiang);  Li, YD (Li, Yu-Dong);  Wen, L (Wen, Lin);  Zhou, D (Zhou, Dong);  Feng, J (Feng, Jie);  Ma, LD (Ma, Lin-Dong);  Wang, TH (Wang, Tian-Hui);  Cai, YL (Cai, Yu-Long);  Wang, ZM (Wang, Zhi-Ming);  Guo, Q (Guo, Qi)
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质子辐射导致CCD热像素产生的机制研究 期刊论文
微电子学, 2018, 卷号: 48, 期号: 1, 页码: 115-119+125
Authors:  刘元;  文林;  李豫东;  何承发;  郭旗;  孙静;  冯婕;  曾俊哲;  马林东;  张翔;  王田珲
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电荷耦合器件  质子辐射效应  热像素  
不同偏置状态下4T-CMOS图像传感器的总剂量辐射效应 期刊论文
红外与激光工程, 2018, 卷号: 47, 期号: 10, 页码: 316-320
Authors:  马林东;  李豫东;  郭旗;  文林;  周东;  冯婕
Adobe PDF(377Kb)  |  Favorite  |  View/Download:55/0  |  Submit date:2018/11/19
Cmos有源像素传感器  总剂量效应  暗电流  
Total ionizing dose effects in pinned photodiode complementary metal-oxide-semiconductor transistor active pixel sensor 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-5
Authors:  Ma, LD (Ma, Lin-Dong)[ 1,2,3 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Wang, TH (Wang, Tian-Hui)[ 1,2,3 ];  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Wang, ZM (Wang, Zhi-Ming)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ]
Adobe PDF(567Kb)  |  Favorite  |  View/Download:39/0  |  Submit date:2018/11/20
Cmos Active Pixel Sensor  Dark Current  Quantum Efficiency  
CMOS图像传感器光子转移曲线辐照后的退化机理 期刊论文
光学精密工程, 2017, 卷号: 25, 期号: 10, 页码: 2676-2681
Authors:  冯婕;  李豫东;  文林;  周东;  马林东
Adobe PDF(327Kb)  |  Favorite  |  View/Download:80/0  |  Submit date:2017/11/20
Cmos图像传感器  辐照  光子转移曲线  转换增益