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Total dose responses and reliability issues of 65 nm NMOSFETs 期刊论文
Journal of Semiconductors, 2016, 卷号: 37, 期号: 6, 页码: 133-139
Authors:  Yu DZ(余德昭);  Zheng QW(郑齐文);  Cui JW(崔江维);  Zhou H(周航);  Yu XF(余学峰);  Guo Q(郭旗)
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Preparation and thermal-sensitive characteristic of copper doped n-type silicon material 期刊论文
Journal of Semiconductors, 2015, 卷号: 36, 期号: 1, 页码: 013004 (4 pp.)
Authors:  Fan Yanwei;  Zhou Bukang;  Wang Junhua;  Chen Zhaoyang;  Chang Aimin
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The total dose effects on the 1/f noise of deep submicron CMOS transistors 期刊论文
Journal of Semiconductors, 2014, 卷号: 35, 期号: 2, 页码: 7015-7021
Authors:  Hu, Rongbin;  Wang, Yuxin;  Lu, Wu
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3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors 期刊论文
Journal of Semiconductors, 2014, 卷号: 35, 期号: 4, 页码: 60-65
Authors:  Jinxin, Zhang;  Hongxia, Guo;  Lin, Wen;  Qi, Guo;  Jiangwei, Cui;  Xin, Wang;  Wei, Deng;  Qiwen, Zhen;  Xue, Fan;  Yao, Xiao;  Hongxia, G.
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Hot-carrier effects on irradiated deep submicron NMOSFET 期刊论文
Journal of Semiconductors, 2014, 卷号: 35, 期号: 7
Authors:  Cui, Jiangwei;  Zheng, Qiwen;  Yu, Xuefeng;  Cong, Zhongchao;  Zhou, Hang;  Guo, Qi;  Wen, Lin;  Wei, Ying;  Ren, Diyuan
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Total dose effects on the matching properties of deep submicron MOS transistors 期刊论文
Journal of Semiconductors, 2014, 卷号: 35, 期号: 6
Authors:  Wang, Yuxin;  Hu, Rongbin;  Li, Ruzhang;  Chen, Guangbing;  Fu, Dongbing;  Lu, Wu
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Total ionizing dose effects on 12-bit CBCMOS digital-to-analog converters 期刊论文
Journal of Semiconductors, 2013, 卷号: 34, 期号: 12, 页码: 57-63
Authors:  Wang, Xin;  Lu, Wu;  Guo, Qi;  Wu, Xue;  Xi, Shanbin;  Deng, Wei;  Cui, Jiangwei;  Zhang, Jinxin
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Total ionizing dose effects on a radiation-induced BiMOS analog-to-digital converter 期刊论文
Journal of Semiconductors, 2013, 卷号: 34, 期号: 1
Authors:  Wu, Xue;  Lu, Wu;  Wang, Yiyuan;  Xu, Jialing;  Zhang, Leqing;  Lu, Jian;  Yu, Xin;  Zhang, Xingyao;  Hu, Tianle;  Lu, W
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Degradation of the front and back channels in a deep submicron partially depleted SOI NMOSFET under off-state stress 期刊论文
Journal of Semiconductors, 2013, 卷号: 34, 期号: 7, 页码: 074008-1-074008-6
Authors:  Zheng, Qiwen;  Yu, Xuefeng;  Cui, Jiangwei;  Guo, Qi;  Cong, Zhongchao;  Zhang, Xingyao;  Deng, Wei;  Zhang, Xiaofu;  Wu, Zhengxin
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Silicon-on-insulator  Hot-carrier Effect  Hump  Back Gate  
Total dose irradiation and hot-carrier effects of sub-micro NMOSFETs 期刊论文
Journal of Semiconductors, 2012, 卷号: 33, 期号: 1, 页码: 64-67
Authors:  Cui, Jiangwei;  Xue, Yaoguo;  Yu, Xuefeng;  Ren, Diyuan;  Lu, Jian;  Zhang, Xingyao
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