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Radiation effects of the bipolar linear circuits and devices for high and low dose rate total dose irradiations 期刊论文
Research & Progress of Solid State Electronics, 2006, 卷号: 26, 期号: 4, 页码: 471-476
Authors:  Ren Diyuan;  Lu Wu;  Yu Xuefeng;  Guo Qi;  Erkin
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A novel technique for predicting ionizing radiation effects of commercial MOS devices 期刊论文
Chinese Physics, 2004, 卷号: 13, 期号: 6, 页码: 948-953
Authors:  Zhang Guo-Qiang;  Guo Qi;  Erkin;  Lu Wu;  Ren Di-Yuan
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