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一种基于静态随机存储器的辐照偏置系统 专利
专利类型: 发明专利, 公开号: CN103971752A, 公开日期: 2014-08-06,
Inventors:  余学峰;  丛忠超;  郭旗;  崔江维;  郑齐文;  孙静;  周航;  汪波
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微纳大规模集成电路SRAM的总剂量辐射效应及评估方法研究 学位论文
硕士, 北京: 中国科学院大学, 2014
Authors:  丛忠超
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Sram  测试系统  辐照偏置  静态功耗电流  失效模式  
双极电压比较器电离辐射损伤及剂量率效应分析 期刊论文
物理学报, 2014, 卷号: 63, 期号: 2, 页码: 229-235
Authors:  马武英;  陆妩;  郭旗;  何承发;  吴雪;  王信;  丛忠超;  汪波;  玛丽娅
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双极电压比较器  60 Coγ辐照  剂量率效应  辐射损伤  Bipolar Voltage Comparator  60coγ Irradiation  Dose Rate Effect  Ionization Damage  
Research on dark signal degradation in Co-60 gamma-ray-irradiated CMOS active pixel sensor 期刊论文
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 5
Authors:  Wang Bo;  Li Yu-Dong;  Guo Qi;  Liu Chang-Ju;  Wen Lin;  Ma Li-Ya;  Sun Jing;  Wang Hai-Jiao;  Cong Zhong-Chao;  Ma Wu-Ying
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Cmos Aps  Dark Signal  Co-60 Gamma-rays  Damage Mechanism  
60Co-γ射线辐照CMOS有源像素传感器诱发暗信号退化的机理研究 期刊论文
物理学报, 2014, 卷号: 63, 期号: 5, 页码: 313-319
Authors:  汪波;  李豫东;  郭旗;  刘昌举;  文林;  玛丽娅;  孙静;  王海娇;  丛忠超;  马武英
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Cmos有源像素传感器  暗信号  60 Co-γ射线  损伤机理  Cmos Aps  Dark Signal  60 Coγ-rays  Damage Mechanism  
Online and offline test method of total dose radiation damage on static random access memory 期刊论文
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 8, 页码: 329-335
Authors:  Cong, Zhong-Chao;  Yu, Xue-Feng;  Cui, Jiang-Wei;  Zheng, Qi-Wen;  Guo, Qi;  Sun, Jing;  Wang, Bo;  Ma, Wu-Ying;  Ma, Li-Ya;  Zhou, Hang
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Online-test  Offline-test  Static Random Access Memory  Functional Test  
Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation 期刊论文
Chinese Physics B, 2014, 卷号: 23, 期号: 10, 页码: 366-372
Authors:  Zheng, Qi-Wen;  Yu, Xue-Feng;  Cui, Jiang-Wei;  Guo, Qi;  Ren, Di-Yuan;  Cong, Zhong-Chao;  Zhou, Hang
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Total Dose Irradiation  Static Random Access Memory  Pattern Imprinting  Deep Sub-micron  
Thermodynamic impact on total dose effect for semiconductor components 期刊论文
Faguang Xuebao/Chinese Journal of Luminescence, 2014, 卷号: 35, 期号: 4, 页码: 465-469
Authors:  Cong, Zhong-Chao;  Yu, Xue-Feng;  Cui, Jiang-Wei;  Zheng, Qi-Wen;  Guo, Qi;  Sun, Jing;  Zhou, Hang
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research on sram functional failure mode induced by total ionizing dose irradiation 期刊论文
ACTA PHYSICA SINICA, 2013, 卷号: 62, 期号: 11
Authors:  Zheng Qi-Wen;  Yu Xue-Feng;  Cui Jiang-Wei;  Guo Qi;  Ren Di-Yuan;  Cong Zhong-Chao
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Sram  Function Failure  Test Pattern  Data Retention Fault  
总剂量辐射环境中的静态随机存储器功能失效模式研究 期刊论文
物理学报, 2013, 卷号: 62, 期号: 11, 页码: 378-384
Authors:  郑齐文;  余学峰;  崔江维;  郭旗;  任迪远;  丛忠超
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静态随机存储器  功能失效  测试图形  数据保存错误