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The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1920-1927
Authors:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Lu, W (Lu, Wu)[ 1 ];  Guo, HX (Guo, Hongxia)[ 1 ];  Liu, J (Liu, Jie)[ 2 ];  Yu, XF (Yu, Xuefeng)[ 1 ];  Wei, Y (Wei, Ying)[ 1 ];  Wang, L (Wang, Liang)[ 3 ];  Liu, JQ (Liu, Jiaqi)[ 3 ];  He, CF (He, Chengfa)[ 1 ];  Guo, Q (Guo, Qi)
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Charge Sharing  Single-event Upset (Seu)  Static Random Access Memory  Total Ionizing Dose (Tid)  
一种电子加速器及实现电子束低注量环境的方法 专利
专利类型: 发明专利, 公开号: CN103983874B, 公开日期: 2017-08-25,
Inventors:  郭旗;  何承发;  郭红霞;  陈伟;  文林;  孙静;  赵雯
Favorite  |  View/Download:2/0  |  Submit date:2019/08/09
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor 期刊论文
Science China-Information Sciences, 2017, 卷号: 60, 期号: 12, 页码: 1-3
Authors:  Zhang, JX (Zhang, Jinxin);  Guo, HX (Guo, Hongxia);  Zhang, FQ (Zhang, Fengqi);  He, CH (He, Chaohui);  Li, P (Li, Pei);  Yan, YY (Yan, Yunyi);  Wang, H (Wang, Hui);  Zhang, LX (Zhang, Linxia)
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An Investigation of ELDRS in Different SiGe Processes 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 期号: 5, 页码: 1137-1141
Authors:  Li, P (Li, Pei);  He, CH (He, Chaohui);  Guo, HX (Guo, Hongxia);  Guo, Q (Guo, Qi);  Zhang, JX (Zhang, Jinxin);  Liu, MH (Liu, Mohan)
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Different Silicon-germanium (Sige) Process  Emitter-base (Eb)-spacer Geometry  Enhanced Low Dose Rate Sensitivity (Eldrs)  Isolation Structure  
Impact of Bias Conditions on Total Ionizing Dose Effects of Co-60 gamma in SiGe HBT 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, 卷号: 63, 期号: 2, 页码: 1251-1258
Authors:  Zhang, JX (Zhang, Jinxin);  Guo, Q (Guo, Qi);  Guo, HX (Guo, Hongxia);  Lu, W (Lu, Wu);  He, CH (He, Chaohui);  Wang, X (Wang, Xin)[ 2 ];  Li, P (Li, Pei);  Liu, M (Liu, Mohan)
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Bias Conditions  Co-60 Gamma Irradiation  Sige Hbt  Total Ionizing Dose Effect  
锗硅异质结双极晶体管单粒子效应加固设计与仿真 期刊论文
物理学报, 2015, 卷号: 64, 期号: 11, 页码: 415-421
Authors:  李培;  郭红霞;  郭旗;  文林;  崔江维;  王信;  张晋新
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锗硅异质结双极晶体管  单粒子效应  加固设计  伪集电极  
基于仿真的锗硅异质结双极晶体管抗单粒子效应加固方法 专利
专利类型: 发明专利, 公开号: CN104133974A, 公开日期: 2014-11-05,
Inventors:  郭红霞;  郭旗;  李培;  文林;  王信;  刘默寒;  崔江维;  陆妩;  余学峰;  何承发
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一种提高器件抗电离辐射总剂量效应的方法 专利
专利类型: 发明专利, 公开号: CN103996673A, 公开日期: 2014-08-20,
Inventors:  郭红霞;  陈伟;  郭旗;  何承发;  罗尹虹;  文林;  王玲;  张凤祁;  赵雯;  肖尧
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基于仿真的锗硅异质结双极晶体管单粒子效应检测方法 专利
专利类型: 发明专利, 公开号: CN103645430A, 公开日期: 2014-03-19,
Inventors:  郭红霞;  郭旗;  张晋新;  文林;  陆妩;  余学峰;  何承发;  崔江维;  孙静;  席善斌;  邓伟;  王信
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不同偏置影响锗硅异质结双极晶体管单粒子效应的三维数值仿真研究 期刊论文
物理学报, 2014, 卷号: 63, 期号: 24, 页码: 446-453
Authors:  张晋新;  贺朝会;  郭红霞;  唐杜;  熊涔;  李培;  王信
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锗硅异质结双极晶体管  不同偏置  单粒子效应  三维数值仿真