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电离辐射对部分耗尽绝缘体上硅器件低频噪声特性的影响 期刊论文
物理学报, 2015, 卷号: 64, 期号: 7, 页码: 393-398
Authors:  刘远;  陈海波;  何玉娟;  王信;  岳龙;  恩云飞;  刘默寒
Adobe PDF(748Kb)  |  Favorite  |  View/Download:134/0  |  Submit date:2015/06/26
绝缘体上硅  部分耗尽  电离辐射  低频噪声  
Radiation effects on the low frequency noise in partially depleted silicon on insulator transistors 期刊论文
ACTA PHYSICA SINICA, 2015, 卷号: 64, 期号: 7
Authors:  Liu, Y (Liu Yuan);  Chen, HB (Chen Hai-Bo);  He, YJ (He Yu-Juan);  Wang, X (Wang Xin);  Yue, L (Yue Long);  En, YF (En Yun-Fei);  Liu, MH (Liu Mo-Han)
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SilicOn On Insulator  Partially Depleted  Ionizing Radiation  Low Frequency Noise