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Synergistic effect of enhanced low-dose-rate sensitivity and single event transient in bipolar voltage comparator LM139 期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2019, 卷号: 56, 期号: 2, 页码: 172-178
Authors:  Yao, S (Yao, Shuai)[ 1,2,3 ];  Lu, W (Lu, Wu)[ 1,2,4 ];  Yu, X (Yu, Xin)[ 1,2 ];  Wang, X (Wang, Xin)[ 1,2 ];  Li, XL (Li, Xiaolong)[ 1,2,3 ];  Liu, MH (Liu, Mohan)[ 1,2,3 ];  Sun, J (Sun, Jing)[ 1,2 ];  Wei, XY (Wei, XinYu)[ 1,2 ];  Chang, YD (Chang, YaoDong)[ 1,2 ];  Guo, Q (Guo, Qi)[ 1,2 ];  He, CF (He, ChengFa)[ 1,2 ]
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Enhanced low dose rate sensitivity  single event transient  bipolar voltage comparator  synergistic effect  
国产pnp双极晶体管在宽总剂量范围辐照下的ELDRS 期刊论文
半导体技术, 2018, 卷号: 43, 期号: 5, 页码: 369-374
Authors:  魏昕宇;  陆妩;  李小龙;  王信;  孙静;  于新;  姚帅;  刘默寒;  郭旗
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国产pnp型双极晶体管  宽总剂量范围  低剂量率损伤增强效应(Eldrs)  辐射损伤  剂量率  
Using temperature-switching approach to evaluate the ELDRS of bipolar devices 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2018, 卷号: 172, 期号: 11-12, 页码: 824-834
Authors:  Li, XL (Li, Xiaolong);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Guo, Q (Guo, Qi);  Yu, X (Yu, Xin);  He, CF (He, Chengfa);  Sun, J (Sun, Jing);  Liu, MH (Liu, Mohan);  Yao, S (Yao, Shuai);  Wei, XY (Wei, Xinyu)查看 ResearcherID 和 ORCID
Adobe PDF(1644Kb)  |  Favorite  |  View/Download:25/0  |  Submit date:2018/07/24
Bipolar Technology  Co-60 Gamma Irradiation  Enhanced Low-dose Rate Sensitivity (Eldrs)  Temperature-switching Approach (Tsa)  
双多晶自对准NPN管的总剂量辐射效应研究 期刊论文
微电子学, 2018, 卷号: 48, 期号: 1, 页码: 120-125
Authors:  贾金成;  陆妩;  吴雪;  张培健;  孙静;  王信;  李小龙;  刘默寒;  郭旗;  刘元
Adobe PDF(1160Kb)  |  Favorite  |  View/Download:44/0  |  Submit date:2018/03/19
双多晶自动准  Npn管  60co-γ辐射  辐射损伤  
典型模拟电路低剂量率辐照损伤增强效应的研究与评估 期刊论文
物理学报, 2018, 卷号: 67, 期号: 9, 页码: 202-209
Authors:  李小龙;  陆妩;  王信;  郭旗;  何承发;  孙静;  于新;  刘默寒;  贾金成;  姚帅;  魏昕宇
Adobe PDF(618Kb)  |  Favorite  |  View/Download:53/1  |  Submit date:2018/09/12
双极模拟电路  低剂量率辐照损伤增强效应  加速评估方法  
双极电压比较器高低剂量率辐照损伤特性 期刊论文
核技术, 2018, 卷号: 41, 期号: 9, 页码: 13-19
Authors:  贾金成;  李小龙;  陆妩;  孙静;  王信;  刘默寒;  魏昕宇;  姚帅;  郭旗
Adobe PDF(828Kb)  |  Favorite  |  View/Download:17/0  |  Submit date:2018/10/18
双极电压比较器  60Co-γ辐照  剂量率影响  
An Investigation of ELDRS in Different SiGe Processes 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 期号: 5, 页码: 1137-1141
Authors:  Li, P (Li, Pei);  He, CH (He, Chaohui);  Guo, HX (Guo, Hongxia);  Guo, Q (Guo, Qi);  Zhang, JX (Zhang, Jinxin);  Liu, MH (Liu, Mohan)
Adobe PDF(386Kb)  |  Favorite  |  View/Download:93/2  |  Submit date:2017/06/20
Different Silicon-germanium (Sige) Process  Emitter-base (Eb)-spacer Geometry  Enhanced Low Dose Rate Sensitivity (Eldrs)  Isolation Structure  
高能56Fe离子入射屏蔽材料的次级粒子模拟分析 期刊论文
核技术, 2016, 卷号: 39, 期号: 6, 页码: 32-38
Authors:  荀明珠;  何承发;  陆妩;  郭旗;  孙静;  刘默寒;  曾骏哲;  王信
Adobe PDF(468Kb)  |  Favorite  |  View/Download:109/1  |  Submit date:2016/12/03
Geant4  次级粒子  屏蔽材料  高能重离子  
Impact of Bias Conditions on Total Ionizing Dose Effects of Co-60 gamma in SiGe HBT 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, 卷号: 63, 期号: 2, 页码: 1251-1258
Authors:  Zhang, JX (Zhang, Jinxin);  Guo, Q (Guo, Qi);  Guo, HX (Guo, Hongxia);  Lu, W (Lu, Wu);  He, CH (He, Chaohui);  Wang, X (Wang, Xin)[ 2 ];  Li, P (Li, Pei);  Liu, M (Liu, Mohan)
Adobe PDF(1341Kb)  |  Favorite  |  View/Download:94/0  |  Submit date:2016/12/12
Bias Conditions  Co-60 Gamma Irradiation  Sige Hbt  Total Ionizing Dose Effect  
电离辐射对部分耗尽绝缘体上硅器件低频噪声特性的影响 期刊论文
物理学报, 2015, 卷号: 64, 期号: 7, 页码: 393-398
Authors:  刘远;  陈海波;  何玉娟;  王信;  岳龙;  恩云飞;  刘默寒
Adobe PDF(748Kb)  |  Favorite  |  View/Download:121/0  |  Submit date:2015/06/26
绝缘体上硅  部分耗尽  电离辐射  低频噪声