XJIPC OpenIR

Browse/Search Results:  1-4 of 4 Help

Filters    
Selected(0)Clear Items/Page:    Sort:
星用双极器件及模拟电路的低剂量率辐射损伤增强效应研究 成果
新疆维吾尔自治区科学技术进步奖, 2015
Accomplishers:  陆妩;  任迪远;  郭旗;  余学峰;  何承发;  文林;  孙静;  李豫东;  崔江维;  吕小龙;  胡江生;  王嘉
Favorite  |  View/Download:36/0  |  Submit date:2017/08/08
Reliability of partially-depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistor under the ionizing radiation environment 期刊论文
ACTA PHYSICA SINICA, 2015, 卷号: 64, 期号: 8
Authors:  Zhou, H (Zhou Hang);  Cui, JW (Cui Jiang-Wei);  Zheng, QW (Zheng Qi-Wen);  Guo, Q (Guo Qi);  Ren, DY (Ren Di-Yuan);  Yu, XF (Yu Xue-Feng);  Yu, XF
Adobe PDF(465Kb)  |  Favorite  |  View/Download:36/0  |  Submit date:2018/01/26
Reliability  Silicon-on-insulator N-channel Metal-oxide-semiconductor Field-effect Transistor  Total Ionizing Dose Effect  Electrical Stress  
Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation 期刊论文
CHINESE PHYSICS B, 2015, 卷号: 24, 期号: 10
Authors:  Zheng, QW (Zheng Qi-Wen);  Cui, JW (Cui Jiang-Wei);  Zhou, H (Zhou Hang);  Yu, DZ (Yu De-Zhao);  Yu, XF (Yu Xue-Feng);  Lu, W (Lu Wu);  Guo, Q (Guo Qi);  Ren, DY (Ren Di-Yuan)
Adobe PDF(315Kb)  |  Favorite  |  View/Download:26/0  |  Submit date:2017/09/21
Total Dose Irradiation  Static Random Access Memory  Functional Failure Mode  
电离辐射环境下的部分耗尽绝缘体上硅n型金属氧化物半导体场效应晶体管可靠性研究 期刊论文
物理学报, 2015, 卷号: 64, 期号: 8, 页码: 250-256
Authors:  周航;  崔江维;  郑齐文;  郭旗;  任迪远;  余学峰
Adobe PDF(664Kb)  |  Favorite  |  View/Download:253/0  |  Submit date:2015/06/26
可靠性  绝缘体上硅n型金属氧化物半导体场效应晶体管  总剂量效应  电应力