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Enhanced channel hot carrier effect of 0.13 mu m silicon-on-insulator N metal-oxide-semiconductor field-effect transistor induced by total ionizing dose effect 期刊论文
ACTA PHYSICA SINICA, 2016, 卷号: 65, 期号: 9
Authors:  Zhou, H (Zhou Hang);  Zheng, QW (Zheng Qi-Wen);  Cui, JW (Cui Jiang-Wei);  Yu, XF (Yu Xue-Feng);  Guo, Q (Guo Qi);  Ren, DY (Ren Di-Yuan);  Yu, DZ (Yu De-Zhao);  Su, DD (Su Dan-Dan);  Yu, XF
Adobe PDF(619Kb)  |  Favorite  |  View/Download:68/0  |  Submit date:2016/12/12
Silicon-on-insulator  Ionizing Radiation  Hot Carriers  
Reliability of partially-depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistor under the ionizing radiation environment 期刊论文
ACTA PHYSICA SINICA, 2015, 卷号: 64, 期号: 8
Authors:  Zhou, H (Zhou Hang);  Cui, JW (Cui Jiang-Wei);  Zheng, QW (Zheng Qi-Wen);  Guo, Q (Guo Qi);  Ren, DY (Ren Di-Yuan);  Yu, XF (Yu Xue-Feng);  Yu, XF
Adobe PDF(465Kb)  |  Favorite  |  View/Download:36/0  |  Submit date:2018/01/26
Reliability  Silicon-on-insulator N-channel Metal-oxide-semiconductor Field-effect Transistor  Total Ionizing Dose Effect  Electrical Stress  
Online and offline test method of total dose radiation damage on static random access memory 期刊论文
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 8, 页码: 329-335
Authors:  Cong, Zhong-Chao;  Yu, Xue-Feng;  Cui, Jiang-Wei;  Zheng, Qi-Wen;  Guo, Qi;  Sun, Jing;  Wang, Bo;  Ma, Wu-Ying;  Ma, Li-Ya;  Zhou, Hang
Adobe PDF(3161Kb)  |  Favorite  |  View/Download:158/0  |  Submit date:2014/11/11
Online-test  Offline-test  Static Random Access Memory  Functional Test  
Theorical model of enhanced low dose rate sensitivity observed in p-type metal-oxide-semiconductor field-effect transistor 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 6
Authors:  Gao Bo;  Yu Xue-Feng;  Ren Di-Yuan;  Cui Jiang-Wei;  Lan Bo;  Li Ming;  Wang Yi-Yuan;  Yu, XF
Adobe PDF(352Kb)  |  Favorite  |  View/Download:160/1  |  Submit date:2012/11/29
P-type Metal-oxide-semiconductor Field-effect Transistor  Co-60 Gamma-ray  Total-dose Irradiation Damage Effects  Enhanced Low Dose Rate Sensitivity  
Degradation and dose rate effects of bipolar linear regulator on ionizing radiation 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 9, 页码: 500-508
Authors:  Wang Yi-Yuan;  Lu Wu;  Ren Di-Yuan;  Guo Qi;  Yu Xue-Feng;  He Cheng-Fa;  Gao Bo
Adobe PDF(560Kb)  |  Favorite  |  View/Download:220/7  |  Submit date:2012/11/29
Bipolar Linear Regulators  Total Ionizing Dose  Dose Rate Effect  Radiation Damage  
Research on the total-dose irradiation damage effect for static random access memory-based field programmable gate array 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 3, 页码: 442-447
Authors:  Gao Bo;  Yu Xue-Feng;  Ren Di-Yuan;  Li Yu-Dong;  Cui Jiang-Wei;  Li Mao-Shun;  Li Ming;  Wang Yi-Yuan
Adobe PDF(268Kb)  |  Favorite  |  View/Download:187/5  |  Submit date:2012/11/29
(60)Co Gamma  Total-dose Irradiation Damage Effects  Sram-based Fpga  Cmos Cell  
Characteristics of high- and low-dose-rate damage for domestic npn transistors of various emitter areas 期刊论文
ACTA PHYSICA SINICA, 2009, 卷号: 58, 期号: 8, 页码: 5572-5577
Authors:  Zheng Yu-Zhan;  Lu Wu;  Ren Di-Yuan;  Wang Yi-Yuan;  Guo Qi;  Yu Xue-Feng;  He Cheng-Fa
Adobe PDF(260Kb)  |  Favorite  |  View/Download:220/10  |  Submit date:2012/11/29
Emitter Area  Domestic Npn Transistors  Dose Rate  Radiation Damage