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Total Ionizing Dose Responses of Forward Body Bias Ultra-Thin Body and Buried Oxide FD-SOI Transistors 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 4, 页码: 702-709
Authors:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Xu, LW (Xu, Liewei)[ 2 ];  Ning, BX (Ning, Bingxu)[ 3 ];  Zhao, K (Zhao, Kai)[ 3 ];  Shen, MJ (Shen, Mingjie)[ 3 ];  Yu, XF (Yu, Xuefeng)[ 1 ];  Lu, W (Lu, Wu)[ 1 ];  He, CF (He, Chengfa)[ 1 ];  Ren, DY (Ren, Diyuan)[ 1 ];  Guo, Q (Guo, Qi)
Adobe PDF(1909Kb)  |  Favorite  |  View/Download:36/0  |  Submit date:2019/05/14
Back-gate biasing  forward body bias (FBB)  total ionizing dose (TID)  ultrathin body and buried oxide fully depleted silicon-on-insulator (UTBB FD-SOI)  
Spectral and electrical properties of 3 MeV and 10 MeV proton irradiated InGaAsP single junction solar cell 期刊论文
JAPANESE JOURNAL OF APPLIED PHYSICS, 2019, 卷号: 58, 期号: 3, 页码: 1-6
Authors:  Xu, Y (Xu, Yan)[ 1,2 ];  Heini, M (Heini, Maliya)[ 2 ];  Shen, XB (Shen, Xiaobao)[ 2,3 ];  Aierken, A (Aierken, Abuduwayiti)[ 2,4 ];  Zhao, XF (Zhao, Xiaofan)[ 2 ];  Sailai, M (Sailai, Momin)[ 2 ];  Lu, W (Lu, Wu)[ 2 ];  Tan, M (Tan, Ming)[ 5 ];  Wu, YY (Wu, Yuanyuan)[ 5 ];  Lu, SL (Lu, Shulong)[ 5 ];  Li, YD (Li, Yudong)[ 2 ];  Guo, Q (Guo, Qi)[ 2 ]
Adobe PDF(740Kb)  |  Favorite  |  View/Download:60/1  |  Submit date:2019/03/19
Investigating the TDDB lifetime growth mechanism caused by proton irradiation in partially depleted SOI devices 期刊论文
MICROELECTRONICS RELIABILITY, 2018, 卷号: 81, 期号: 2, 页码: 112-116
Authors:  Ma, T (Ma, Teng);  Yu, XF (Yu, Xuefeng);  Cui, JW (Cui, Jiangwei);  Zheng, QW (Zheng, Qiwen);  Zhou, H (Zhou, Hang);  Su, DD (Su, Dandan);  Guo, Q (Guo, Qi)
Adobe PDF(589Kb)  |  Favorite  |  View/Download:47/1  |  Submit date:2018/03/14
Reliability  Proton Irradiation  Radiation Induced Leakage Current (Rilc)  Time-dependent Dielectric Breakdown (Tddb)  Total Ionizing Does (Tid)  
Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs 期刊论文
CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 4, 页码: 1-4
Authors:  Zheng, QW (Zheng, Qi-Wen);  Cui, JW (Cui, Jiang-Wei);  Wei, Y (Wei, Ying);  Yu, XF (Yu, Xue-Feng);  Lu, W (Lu, Wu);  Ren, DY (Ren, Diyuan);  Guo, Q (Guo, Qi)
Adobe PDF(713Kb)  |  Favorite  |  View/Download:29/0  |  Submit date:2018/05/07
Read Static Noise Margin Decrease of 65-nm 6-T SRAM Cell Induced by Total Ionizing Dose 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 2, 页码: 691-697
Authors:  Zheng, QW (Zheng, Qiwen);  Cui, JW (Cui, Jiangwei);  Yu, XF (Yu, Xuefeng);  Lu, W (Lu, Wu);  He, CF (He, Chengfa);  Ma, T (Ma, Teng);  Zhao, JH (Zhao, Jinghao);  Ren, DY (Ren, Diyuan);  Guo, Q (Guo, Qi);  Zheng, QW
Adobe PDF(1382Kb)  |  Favorite  |  View/Download:34/0  |  Submit date:2018/05/15
Static Noise Margin (Snm)  Static Random Access Memory (Sram)  Total Ionizing Dose (Tid)  
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1920-1927
Authors:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Lu, W (Lu, Wu)[ 1 ];  Guo, HX (Guo, Hongxia)[ 1 ];  Liu, J (Liu, Jie)[ 2 ];  Yu, XF (Yu, Xuefeng)[ 1 ];  Wei, Y (Wei, Ying)[ 1 ];  Wang, L (Wang, Liang)[ 3 ];  Liu, JQ (Liu, Jiaqi)[ 3 ];  He, CF (He, Chengfa)[ 1 ];  Guo, Q (Guo, Qi)
Adobe PDF(1450Kb)  |  Favorite  |  View/Download:54/1  |  Submit date:2018/09/27
Charge Sharing  Single-event Upset (Seu)  Static Random Access Memory  Total Ionizing Dose (Tid)  
An Increase in TDDB Lifetime of Partially Depleted SOI Devices Induced by Proton Irradiation 期刊论文
CHINESE PHYSICS LETTERS, 2017, 卷号: 34, 期号: 7, 页码: 181-184
Authors:  Ma, T (Ma, Teng);  Zheng, QW (Zheng, Qi-Wen);  Cui, JW (Cui, Jiang-Wei);  Zhou, H (Zhou, Hang);  Su, DD (Su, Dan-Dan);  Yu, XF (Yu, Xue-Feng);  Guo, Q (Guo, Qi)
Adobe PDF(686Kb)  |  Favorite  |  View/Download:31/0  |  Submit date:2017/12/14
Direct measurement and analysis of total ionizing dose effect on 130 nm PD SOI SRAM cell static noise margin 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 9, 页码: 1-5
Authors:  Zheng, QW (Zheng, Qiwen);  Cui, JW (Cui, Jiangwei);  Liu, MX (Liu, Mengxin);  Su, DD (Su, Dandan);  Zhou, H (Zhou, Hang);  Ma, T (Ma, Teng);  Yu, XF (Yu, Xuefeng);  Lu, W (Lu, Wu);  Guo, Q (Guo, Qi);  Zhao, FZ (Zhao, Fazhan)
Adobe PDF(496Kb)  |  Favorite  |  View/Download:45/0  |  Submit date:2017/12/05
Silicon-on-insulator  Total Ionizing Dose  Static Random Access Memory  Static Noise Margin  
1-MeV electron irradiation effects on InGaAsP/InGaAs double-junction solar cell and its component subcells 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2017, 卷号: 60, 期号: 12, 页码: 1-3
Authors:  Zhao, XF (Zhao, Xiaofan)[ 1,2,3 ];  Heini, M (Heini, Maliya)[ 1,2 ];  Sailai, M (Sailai, Momin)[ 1,2,3 ];  Aierken, A (Aierken, Abuduwayiti)[ 1,2 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Li, YD (Li, Yudong)[ 1,2 ];  Lu, SL (Lu, Shulong)[ 4 ];  Dai, P (Dai, Pan)[ 4 ];  Wu, YY (Wu, Yuanyuan)[ 4 ];  Tan, M (Tan, Ming)[ 4 ]
Adobe PDF(125Kb)  |  Favorite  |  View/Download:97/0  |  Submit date:2017/11/22
EPMDA: an expression-profile based computational model for microRNA-disease association prediction 期刊论文
ONCOTARGET, 2017, 卷号: 8, 期号: 50, 页码: 87033-87043
Authors:  Huang, YA (Huang, Yu-An);  You, ZH (You, Zhu-Hong);  Li, LP (Li, Li-Ping);  Huang, ZA (Huang, Zhi-An);  Xiang, LX (Xiang, Lu-Xuan);  Li, XF (Li, Xiao-Fang);  Lv, LT (Lv, Lin-Tao)
Adobe PDF(3241Kb)  |  Favorite  |  View/Download:27/0  |  Submit date:2017/11/30
Disease  Microrna  Expression Profile  Biomarker