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一种用于光电材料光致发光谱辐射损伤的测试方法 专利
专利类型: 发明专利, 公开号: CN106370629A, 公开日期: 2017-02-01,
Inventors:  郭旗;  玛丽娅·黑尼;  艾尔肯·阿不都瓦衣提;  李豫东;  文林;  周东;  张兴尧;  陆妩;  余学峰;  何承发
Favorite  |  View/Download:0/0  |  Submit date:2019/08/07
Direct measurement and analysis of total ionizing dose effect on 130 nm PD SOI SRAM cell static noise margin 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 9, 页码: 1-5
Authors:  Zheng, QW (Zheng, Qiwen);  Cui, JW (Cui, Jiangwei);  Liu, MX (Liu, Mengxin);  Su, DD (Su, Dandan);  Zhou, H (Zhou, Hang);  Ma, T (Ma, Teng);  Yu, XF (Yu, Xuefeng);  Lu, W (Lu, Wu);  Guo, Q (Guo, Qi);  Zhao, FZ (Zhao, Fazhan)
Adobe PDF(496Kb)  |  Favorite  |  View/Download:44/0  |  Submit date:2017/12/05
Silicon-on-insulator  Total Ionizing Dose  Static Random Access Memory  Static Noise Margin  
Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation 期刊论文
CHINESE PHYSICS B, 2015, 卷号: 24, 期号: 10
Authors:  Zheng, QW (Zheng Qi-Wen);  Cui, JW (Cui Jiang-Wei);  Zhou, H (Zhou Hang);  Yu, DZ (Yu De-Zhao);  Yu, XF (Yu Xue-Feng);  Lu, W (Lu Wu);  Guo, Q (Guo Qi);  Ren, DY (Ren Di-Yuan)
Adobe PDF(315Kb)  |  Favorite  |  View/Download:26/0  |  Submit date:2017/09/21
Total Dose Irradiation  Static Random Access Memory  Functional Failure Mode  
serial ferroelectric memory ionizing radiation effects and annealing characteristics 期刊论文
ACTA PHYSICA SINICA, 2013, 卷号: 62, 期号: 15, 页码: 347-352
Authors:  Zhang Xing-Yao;  Guo Qi;  Lu Wu;  Zhang Xiao-Fu;  Zheng Qi-Wen;  Cui Jiang-Wei;  Li Yu-Dong;  Zhou Dong
Adobe PDF(235Kb)  |  Favorite  |  View/Download:137/1  |  Submit date:2013/11/07
Ferroelectric Random Memory  Ionizing Radiation Effects  Annealing Characteristics  
串口型铁电存储器总剂量辐射损伤效应和退火特性 期刊论文
物理学报, 2013, 卷号: 62, 期号: 15, 页码: 347-352
Authors:  张兴尧;  郭旗;  陆妩;  张孝富;  郑齐文;  崔江维;  李豫东;  周东
Adobe PDF(444Kb)  |  Favorite  |  View/Download:238/0  |  Submit date:2013/11/06
铁电存储器  总剂量辐射  退火特性  
CCD在不同注量率电子辐照下的辐射效应研究 期刊论文
原子能科学技术, 2012, 卷号: 46, 期号: 3, 页码: 346-350
Authors:  李豫东;  郭旗;  陆妩;  周东;  何承发;  余学峰
Adobe PDF(252Kb)  |  Favorite  |  View/Download:232/11  |  Submit date:2012/11/29
线阵ccd  电子辐照  电离总剂量效应  时间相关效应