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Total dose responses and reliability issues of 65 nm NMOSFETs 期刊论文
Journal of Semiconductors, 2016, 卷号: 37, 期号: 6, 页码: 133-139
Authors:  Yu DZ(余德昭);  Zheng QW(郑齐文);  Cui JW(崔江维);  Zhou H(周航);  Yu XF(余学峰);  Guo Q(郭旗)
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Hot-carrier effects on irradiated deep submicron NMOSFET 期刊论文
Journal of Semiconductors, 2014, 卷号: 35, 期号: 7
Authors:  Cui, Jiangwei;  Zheng, Qiwen;  Yu, Xuefeng;  Cong, Zhongchao;  Zhou, Hang;  Guo, Qi;  Wen, Lin;  Wei, Ying;  Ren, Diyuan
Adobe PDF(752Kb)  |  Favorite  |  View/Download:176/0  |  Submit date:2014/11/11