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Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 3, 页码: 1-9
Authors:  Li, XL (Li, Xiao-Long);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Yu, X (Yu, Xin);  Guo, Q (Guo, Qi);  Sun, J (Sun, Jing);  Liu, MH (Liu, Mo-Han);  Yao, S (Yao, Shuai);  Wei, XY (Wei, Xin-Yu);  He, CF (He, Cheng-Fa)
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Ionizing Radiation Damage  Enhanced Low Dose Rate Sensitivity (Eldrs)  Switched Temperature Irradiation  Gate-controlled Lateral Pnp Transistor (glPnp)  
国产pnp双极晶体管在宽总剂量范围辐照下的ELDRS 期刊论文
半导体技术, 2018, 卷号: 43, 期号: 5, 页码: 369-374
Authors:  魏昕宇;  陆妩;  李小龙;  王信;  孙静;  于新;  姚帅;  刘默寒;  郭旗
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国产pnp型双极晶体管  宽总剂量范围  低剂量率损伤增强效应(Eldrs)  辐射损伤  剂量率  
Estimation of low-dose-rate degradation on bipolar linear circuits using different accelerated evaluation methods 期刊论文
ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 9, 页码: 202-209
Authors:  Li, XL (Li Xiao-Long)[ 1,2,3 ];  Lu, W (Lu Wu)[ 1,2 ];  Wang, X (Wang Xin)[ 1,2,3 ];  Guo, Q (Guo Qi)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1,2 ];  Sun, J (Sun Jing)[ 1,2 ];  Yu, X (Yu Xin)[ 1,2 ];  Liu, MH (Liu Mo-Han)[ 1,2,3 ];  Jia, JC (Jia Jin-Cheng)[ 1,2,3 ];  Yao, S (Yao Shuai)[ 1,2,3 ];  Wei, XY (Wei Xin-Yu)[ 1,2,3 ]
Adobe PDF(531Kb)  |  Favorite  |  View/Download:84/0  |  Submit date:2018/09/27
Bipolar Circuit  Enhanced Low-dose-rate Sensitivity  Accelerated Evaluation Method  
典型模拟电路低剂量率辐照损伤增强效应的研究与评估 期刊论文
物理学报, 2018, 卷号: 67, 期号: 9, 页码: 202-209
Authors:  李小龙;  陆妩;  王信;  郭旗;  何承发;  孙静;  于新;  刘默寒;  贾金成;  姚帅;  魏昕宇
Adobe PDF(618Kb)  |  Favorite  |  View/Download:63/1  |  Submit date:2018/09/12
双极模拟电路  低剂量率辐照损伤增强效应  加速评估方法  
双极电压比较器高低剂量率辐照损伤特性 期刊论文
核技术, 2018, 卷号: 41, 期号: 9, 页码: 13-19
Authors:  贾金成;  李小龙;  陆妩;  孙静;  王信;  刘默寒;  魏昕宇;  姚帅;  郭旗
Adobe PDF(828Kb)  |  Favorite  |  View/Download:21/0  |  Submit date:2018/10/18
双极电压比较器  60Co-γ辐照  剂量率影响  
Simulation of Synergism Effect Using Temperature Switching Irradiation on Bipolar Comparator 期刊论文
CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 8, 页码: 1-4
Authors:  Yu, X (Yu, Xin)[ 1,2 ];  Lu, W (Lu, Wu)[ 1,2 ];  Yao, S (Yao, Shuai)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Sun, J (Sun, Jing)[ 1,2 ];  Wang, X (Wang, Xin)[ 1,2 ];  Liu, MH (Liu, Mo-Han)[ 1,2 ];  Li, XL (Li, Xiao-Long)[ 1,2,3 ]
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Single-event response of the SiGe HBT in TCAD simulations and laser microbeam experiment 期刊论文
CHINESE PHYSICS B, 2015, 卷号: 24, 期号: 8
Authors:  Li, P (Li Pei);  Guo, HX (Guo Hong-Xia);  Guo, Q (Guo Qi);  Zhang, JX (Zhang Jin-Xin);  Xiao, Y (Xiao Yao);  Wei, Y (Wei Ying);  Cui, JW (Cui Jiang-Wei);  Wen, L (Wen Lin);  Liu, MH (Liu Mo-Han);  Wang, X (Wang Xin)
Adobe PDF(1156Kb)  |  Favorite  |  View/Download:18/0  |  Submit date:2017/09/14
Sige Heterojunction Bipolar Transistor  Single Event Effect  Three-dimensional Numerical Simulation  Laser Microbeam Experiment  
3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors 期刊论文
Journal of Semiconductors, 2014, 卷号: 35, 期号: 4, 页码: 60-65
Authors:  Jinxin, Zhang;  Hongxia, Guo;  Lin, Wen;  Qi, Guo;  Jiangwei, Cui;  Xin, Wang;  Wei, Deng;  Qiwen, Zhen;  Xue, Fan;  Yao, Xiao;  Hongxia, G.
Adobe PDF(1242Kb)  |  Favorite  |  View/Download:156/0  |  Submit date:2014/11/11
累积剂量影响静态随机存储器单粒子效应敏感性研究 期刊论文
物理学报, 2014, 卷号: 63, 期号: 1, 页码: 387-392
Authors:  肖尧;  郭红霞;  张凤祁;  赵雯;  王燕萍;  丁李利;  范雪;  罗尹虹;  张科营
Adobe PDF(719Kb)  |  Favorite  |  View/Download:165/0  |  Submit date:2014/11/11
累积剂量  单粒子效应  静态随机存储器  反印记效应  
60Coγ射线对高铝组分Al0.5Ga0.5N基p-i-n日盲型光探测器理想因子的影响 期刊论文
物理学报, 2013, 卷号: 62, 期号: 7, 页码: 331-336
Authors:  张孝富;  李豫东;  郭旗;  罗木昌;  何承发;  于新;  申志辉;  张兴尧;  邓伟;  吴正新
Adobe PDF(486Kb)  |  Favorite  |  View/Download:189/3  |  Submit date:2013/05/24
高铝组分alxga1-xn  Γ射线辐射效应  理想因子  欧姆接触