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Compare of total-dose irradiation effects between CMOS 4000 and 54HC devices 期刊论文
He Jishu/Nuclear Techniques, 2008, 卷号: 31, 期号: 5, 页码: 348-351
Authors:  Wang Gaili;  Yu Xuefeng;  Ren Diyuan;  Zheng Yuzhan;  Sun Jing;  Wen Lin
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