XJIPC OpenIR

Browse/Search Results:  1-4 of 4 Help

Filters    
Selected(0)Clear Items/Page:    Sort:
Total ionizing dose effects on a radiation-induced BiMOS analog-to-digital converter 期刊论文
Journal of Semiconductors, 2013, 卷号: 34, 期号: 1
Authors:  Wu, Xue;  Lu, Wu;  Wang, Yiyuan;  Xu, Jialing;  Zhang, Leqing;  Lu, Jian;  Yu, Xin;  Zhang, Xingyao;  Hu, Tianle;  Lu, W
Adobe PDF(701Kb)  |  Favorite  |  View/Download:167/0  |  Submit date:2014/11/11
Impact of doped boron concentration in emitter on high- and low-dose-rate damage in lateral PNP transistors 期刊论文
Journal of Semiconductors, 2010, 卷号: 31, 期号: 3
Authors:  Yuzhan, Zheng;  Wu, Lu;  Diyuan, Ren;  Yiyuan, Wang;  Zhikuan, Wang;  Yonghui, Yang;  Wu, L.
Adobe PDF(690Kb)  |  Favorite  |  View/Download:116/0  |  Submit date:2014/11/11
NTC and electrical properties of nickel and gold doped n-type silicon material 期刊论文
Journal of Semiconductors, 2009, 卷号: 30, 期号: 8, 页码: 52-55
Authors:  Dong, Maojin;  Chen, Zhaoyang;  Fan, Yanwei;  Wang, Junhua;  Tao, Mingde;  Cong, Xiuyun
Adobe PDF(390Kb)  |  Favorite  |  View/Download:118/0  |  Submit date:2014/11/11
Deep Level Impurities  Nickel  Gold  Ntc  Electrical Properties  
Leakage current mechanisms of ultrathin high-k Er2O3 gate dielectric film 期刊论文
Journal of Semiconductors, 2009, 卷号: 30, 期号: 10, 页码: 21-26
Authors:  Wu, Deqi;  Yao, Jincheng;  Zhao, Hongsheng;  Chang, Aimin;  Li, Feng
Adobe PDF(1210Kb)  |  Favorite  |  View/Download:141/0  |  Submit date:2014/11/11
Er_2o_3  High-kappa Gate Dielectrics  Leakage Current  Leakage Current Mechanisms