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Estimation of low-dose-rate degradation on bipolar linear circuits using different accelerated evaluation methods 期刊论文
ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 9, 页码: 202-209
Authors:  Li, XL (Li Xiao-Long)[ 1,2,3 ];  Lu, W (Lu Wu)[ 1,2 ];  Wang, X (Wang Xin)[ 1,2,3 ];  Guo, Q (Guo Qi)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1,2 ];  Sun, J (Sun Jing)[ 1,2 ];  Yu, X (Yu Xin)[ 1,2 ];  Liu, MH (Liu Mo-Han)[ 1,2,3 ];  Jia, JC (Jia Jin-Cheng)[ 1,2,3 ];  Yao, S (Yao Shuai)[ 1,2,3 ];  Wei, XY (Wei Xin-Yu)[ 1,2,3 ]
Adobe PDF(531Kb)  |  Favorite  |  View/Download:84/0  |  Submit date:2018/09/27
Bipolar Circuit  Enhanced Low-dose-rate Sensitivity  Accelerated Evaluation Method  
Research on dark signal degradation in Co-60 gamma-ray-irradiated CMOS active pixel sensor 期刊论文
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 5
Authors:  Wang Bo;  Li Yu-Dong;  Guo Qi;  Liu Chang-Ju;  Wen Lin;  Ma Li-Ya;  Sun Jing;  Wang Hai-Jiao;  Cong Zhong-Chao;  Ma Wu-Ying
Adobe PDF(390Kb)  |  Favorite  |  View/Download:162/0  |  Submit date:2014/11/11
Cmos Aps  Dark Signal  Co-60 Gamma-rays  Damage Mechanism  
Online and offline test method of total dose radiation damage on static random access memory 期刊论文
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 8, 页码: 329-335
Authors:  Cong, Zhong-Chao;  Yu, Xue-Feng;  Cui, Jiang-Wei;  Zheng, Qi-Wen;  Guo, Qi;  Sun, Jing;  Wang, Bo;  Ma, Wu-Ying;  Ma, Li-Ya;  Zhou, Hang
Adobe PDF(3161Kb)  |  Favorite  |  View/Download:158/0  |  Submit date:2014/11/11
Online-test  Offline-test  Static Random Access Memory  Functional Test  
Radiation effect of deep-submicron metal-oxide-semiconductor field-effect transistor and parasitic transistor 期刊论文
ACTA PHYSICA SINICA, 2014, 卷号: 63, 期号: 22
Authors:  Wang, X (Wang Xin);  Lu, W (Lu Wu);  Wu, X (Wu Xue);  Ma, WY (Ma Wu-Ying);  Cui, JW (Cui Jiang-Wei);  Liu, MH (Liu Mo-Han);  Jiang, K (Jiang Ke)
Adobe PDF(481Kb)  |  Favorite  |  View/Download:18/0  |  Submit date:2018/02/01
Total Dose Radiation  Nmosfet  Parasitic Transistor  Bandgap Voltage Reference  
The influence of channel size on total dose irradiation and hot-carrier effects of sub-micro NMOSFET 期刊论文
ACTA PHYSICA SINICA, 2012, 卷号: 61, 期号: 2, 页码: -
Authors:  Cui Jiang-Wei;  Yu Xue-Feng;  Ren Di-Yuan;  Lu Jian;  Cui, JW
Adobe PDF(627Kb)  |  Favorite  |  View/Download:168/4  |  Submit date:2012/11/29
Sub-micro  Total Dose Irradiation  Hot-carrier Effect  
Degradation and dose rate effects of bipolar linear regulator on ionizing radiation 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 9, 页码: 500-508
Authors:  Wang Yi-Yuan;  Lu Wu;  Ren Di-Yuan;  Guo Qi;  Yu Xue-Feng;  He Cheng-Fa;  Gao Bo
Adobe PDF(560Kb)  |  Favorite  |  View/Download:220/7  |  Submit date:2012/11/29
Bipolar Linear Regulators  Total Ionizing Dose  Dose Rate Effect  Radiation Damage