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Process Calculus for Modeling and Quantifying Location Privacy 期刊论文
Procedia Computer Science, 2019, 卷号: 147, 期号: 1, 页码: 407-415
Authors:  Ding, Jingquan;  Li, Xiao;  Guo, Yunchuan;  Yin, Lihua;  Zhang, Huibing
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电荷耦合器件的γ辐照剂量率效应研究 期刊论文
发光学报, 2016, 卷号: 37, 期号: 6, 页码: 711-719
Authors:  武大猷;  文林;  汪朝敏;  何承发;  郭旗;  李豫东;  曾俊哲;  汪波;  刘元
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电荷耦合器件  暗信号  低剂量率损伤增强效应  暗场像素统计  
质子、中子、60Co-γ射线辐照对电荷耦合器件饱和输出电压的影响 期刊论文
红外与激光工程, 2015, 卷号: 44, 期号: S1, 页码: 35-40
Authors:  汪波;  文林;  李豫东;  郭旗;  汪朝敏;  王帆;  任迪远;  曾骏哲;  武大猷
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电荷耦合器件  高能粒子辐照  饱和输出电压  电离总剂量效应  
3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors 期刊论文
Journal of Semiconductors, 2014, 卷号: 35, 期号: 4, 页码: 60-65
Authors:  Jinxin, Zhang;  Hongxia, Guo;  Lin, Wen;  Qi, Guo;  Jiangwei, Cui;  Xin, Wang;  Wei, Deng;  Qiwen, Zhen;  Xue, Fan;  Yao, Xiao;  Hongxia, G.
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变温恒剂量率辐照加速评估方法在双极线性稳压器 LM317上的应用 期刊论文
原子能科学技术, 2014, 卷号: 48, 期号: 4, 页码: 727-733
Authors:  邓伟;  陆妩;  郭旗;  何承发;  吴雪;  王信;  张晋新;  张孝富;  郑齐文;  马武英
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双极线性稳压器  低剂量率损伤增强效应  ~(60)Cogamma辐照  变温恒剂量率辐照  加速评估方法  
Total ionizing dose effects on a radiation-induced BiMOS analog-to-digital converter 期刊论文
Journal of Semiconductors, 2013, 卷号: 34, 期号: 1
Authors:  Wu, Xue;  Lu, Wu;  Wang, Yiyuan;  Xu, Jialing;  Zhang, Leqing;  Lu, Jian;  Yu, Xin;  Zhang, Xingyao;  Hu, Tianle;  Lu, W
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镍掺杂铁酸铋薄膜的电磁性能研究 期刊论文
人工晶体学报, 2013, 卷号: 42, 期号: 9, 页码: 1842-1847
Authors:  刘开通;  李锦;  王磊;  简基康;  徐方龙;  孙言飞
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铁酸铋  镍掺杂  介电  漏电流  
Effect of pH on PCP remediation by smectite supported Pd-0/Fe-0 会议论文
, Guangzhou, PEOPLES R CHINA, December 29, 2012 - December 30, 2012
Authors:  HanJunli;  JiaHanzhong;  SongCunyi
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Pentachlorophenol  Palladized Zero-valent Iron  Smectite  Ph  
Preparation of Ni0.9Mn2.1-xMgxO4 (0 <= x <= 0.3) negative temperature coefficient ceramic materials by a rheological phase reaction method 期刊论文
Materials Letters, 2013, 卷号: 112, 期号: 12, 页码: 69-71
Authors:  Yao, Jincheng;  Zhang, Bingyin;  Wang, Junhua;  Chang, Aimin;  Ji, Guang;  Zhao, Pengjun;  Zhao, Lijun;  Chang, AM
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Ntc Thermistors  Electrical Properties  Rpr-ur Method  Powder Technology  
Total dose irradiation and hot-carrier effects of sub-micro NMOSFETs 期刊论文
Journal of Semiconductors, 2012, 卷号: 33, 期号: 1, 页码: 64-67
Authors:  Cui, Jiangwei;  Xue, Yaoguo;  Yu, Xuefeng;  Ren, Diyuan;  Lu, Jian;  Zhang, Xingyao
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