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超深亚微米互补金属氧化物半导体器件的剂量率效应 期刊论文
物理学报, 2016, 卷号: 65, 期号: 7, 页码: 258-263
Authors:  郑齐文;  崔江维;  王汉宁;  周航;  余徳昭;  魏莹;  苏丹丹
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总剂量辐射效应  超深亚微米  金属氧化物半导体场效应晶体管  静态随机存储器  
总剂量效应致0.13μm部分耗尽绝缘体上硅N型金属氧化物半导体场效应晶体管热载流子增强效应 期刊论文
物理学报, 2016, 卷号: 65, 期号: 9, 页码: 242-249
Authors:  周航;  郑齐文;  崔江维;  余学峰;  郭旗;  任迪远;  余德昭;  苏丹丹
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绝缘体上硅  电离辐射  热载流子  
Enhanced channel hot carrier effect of 0.13 mu m silicon-on-insulator N metal-oxide-semiconductor field-effect transistor induced by total ionizing dose effect 期刊论文
ACTA PHYSICA SINICA, 2016, 卷号: 65, 期号: 9
Authors:  Zhou, H (Zhou Hang);  Zheng, QW (Zheng Qi-Wen);  Cui, JW (Cui Jiang-Wei);  Yu, XF (Yu Xue-Feng);  Guo, Q (Guo Qi);  Ren, DY (Ren Di-Yuan);  Yu, DZ (Yu De-Zhao);  Su, DD (Su Dan-Dan);  Yu, XF
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Silicon-on-insulator  Ionizing Radiation  Hot Carriers  
Dose-rate sensitivity of deep sub-micro complementary metal oxide semiconductor process 期刊论文
ACTA PHYSICA SINICA, 2016, 卷号: 65, 期号: 7
Authors:  Zheng, QW (Zheng Qi-Wen);  Cui, JW (Cui Jiang-Wei);  Wang, HN (Wang Han-Ning);  Zhou, H (Zhou Hang);  Yu, DZ (Yu De-Zhao);  Wei, Y (Wei Ying);  Su, DD (Su Dan-Dan)
Adobe PDF(406Kb)  |  Favorite  |  View/Download:66/0  |  Submit date:2016/12/12
Total Ionizing Dose Effects  Deep Sub-micron  Metal Oxide Semiconductor Field Effect Transistor  Static Random Access Memory  
电离辐射对部分耗尽绝缘体上硅器件低频噪声特性的影响 期刊论文
物理学报, 2015, 卷号: 64, 期号: 7, 页码: 393-398
Authors:  刘远;  陈海波;  何玉娟;  王信;  岳龙;  恩云飞;  刘默寒
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绝缘体上硅  部分耗尽  电离辐射  低频噪声  
Photoluminescence spectra of 1 MeV electron beam irradiated In0.53Ga0.47As/InP quantum well and bulk materials 期刊论文
ACTA PHYSICA SINICA, 2015, 卷号: 64, 期号: 15, 页码: 252-258
Authors:  Ma, LY (Ma Li-Ya);  Li, YD (Li Yu-Dong);  Guo, Q (Guo Qi);  Ai, EK (Ai Er-Ken);  Wang, HJ (Wang Hai-Jiao);  Wang, B (Wang Bo);  Zeng, JZ (Zeng Jun-Zhe)
Adobe PDF(726Kb)  |  Favorite  |  View/Download:35/0  |  Submit date:2018/01/25
In0.53ga0.47as/inp  Quantum Well  Electron Beam Irradiation  Photoluminescence  
Dark signal degradation in proton-irradiated complementary metal oxide semiconductor active pixel sensor 期刊论文
ACTA PHYSICA SINICA, 2015, 卷号: 64, 期号: 8, 页码: 193-199
Authors:  Wang, B (Wang Bo);  Li, YD (Li Yu-Dong);  Guo, Q (Guo Qi);  Liu, CJ (Liu Chang-Ju);  Wen, L (Wen Lin);  Ren, DY (Ren Di-Yuan);  Zeng, JZ (Zeng Jun-Zhe);  Ma, LY (Ma Li-Ya)
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Complementary Metal Oxide Semiconductor Active Pixel Sensor  Dark Signal  Proton Radiation  Displacement Effect  
质子辐射下互补金属氧化物半导体有源像素传感器暗信号退化机理研究 期刊论文
物理学报, 2015, 卷号: 64, 期号: 8, 页码: 193-199
Authors:  汪波;  李豫东;  郭旗;  刘昌举;  文林;  任迪远;  曾骏哲;  玛丽娅
Adobe PDF(754Kb)  |  Favorite  |  View/Download:252/0  |  Submit date:2015/06/26
互补金属氧化物半导体有源像素传感器  暗信号  质子辐射  位移效应  
电子辐射环境中NPN输入双极运算放大器的辐射效应和退火特性 期刊论文
物理学报, 2015, 卷号: 64, 期号: 13, 页码: 302-308
Authors:  姜柯;  陆妩;  胡天乐;  王信;  郭旗;  何承发;  刘默涵;  李小龙
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Npn输入双极运算放大器  电子辐射  辐射效应  退火  
质子与中子辐照对电荷耦合器件暗信号参数的影响及其效应分析 期刊论文
物理学报, 2015, 卷号: 64, 期号: 19, 页码: 173-180
Authors:  曾骏哲;  李豫东;  文林;  何承发;  郭旗;  汪波;  玛丽娅;  魏莹;  王海娇;  武大猷;  王帆;  周航
Adobe PDF(648Kb)  |  Favorite  |  View/Download:123/1  |  Submit date:2016/06/07
电荷耦合器件  质子辐照  中子辐照  输运仿真