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Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 4, 页码: 997-1004
Authors:  Chen, ZJ (Chen, Zhuojun);  Ding, D (Ding, Ding);  Dong, YM (Dong, Yemin);  Shan, Y (Shan, Yi);  Zhou, SX (Zhou, Shuxing);  Hu, YY (Hu, Yuanyuan);  Zheng, YL (Zheng, Yunlong);  Peng, C (Peng, Chao);  Chen, RM (Chen, Rongmei)
Adobe PDF(3470Kb)  |  Favorite  |  View/Download:40/0  |  Submit date:2018/05/07
Phase-locked Loop (Pll)  Phase Noise  Reference Spur  Total Ionizing Dose (Tid)  
SRAM型FPGA器件总剂量辐射效应及评估技术的研究 学位论文
博士, 北京: 中国科学院研究生院, 2011
Authors:  高博
Adobe PDF(6679Kb)  |  Favorite  |  View/Download:87/0  |  Submit date:2016/05/24
Sram型fpga器件  总剂量效应  辐射损伤  评估技术  试验方法  
Research on the total-dose irradiation damage effect for static random access memory-based field programmable gate array 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 3, 页码: 442-447
Authors:  Gao Bo;  Yu Xue-Feng;  Ren Di-Yuan;  Li Yu-Dong;  Cui Jiang-Wei;  Li Mao-Shun;  Li Ming;  Wang Yi-Yuan
Adobe PDF(268Kb)  |  Favorite  |  View/Download:187/5  |  Submit date:2012/11/29
(60)Co Gamma  Total-dose Irradiation Damage Effects  Sram-based Fpga  Cmos Cell  
静态存储器型现场可编程门阵列总剂量辐射损伤效应研究 期刊论文
物理学报, 2011, 卷号: 60, 期号: 3, 页码: 442-447
Authors:  高博;  余学峰;  任迪远;  李豫东;  崔江维;  李茂顺;  李明;  王义元
Adobe PDF(268Kb)  |  Favorite  |  View/Download:160/9  |  Submit date:2012/11/29
60coγ  总剂量辐射损伤效应  Sram型fpga  Cmos单元