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Heavy ion-induced single event effects in active pixel sensor array 期刊论文
SOLID-STATE ELECTRONICS, 2019, 卷号: 152, 期号: 2, 页码: 93-99
Authors:  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Ma, LD (Ma, Lin-Dong)[ 1,2,3 ];  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Wang, TH (Wang, Tian-Hui)[ 1,2,3 ]
Adobe PDF(1340Kb)  |  Favorite  |  View/Download:91/1  |  Submit date:2019/01/03
CMOS active pixel sensor (APS)  SEE  Heavy ion  
高总剂量水平双极器件剂量率效应及加速评估试验方法的研究 学位论文
博士, 北京: 中国科学院大学, 2018
Authors:  李小龙
Adobe PDF(3941Kb)  |  Favorite  |  View/Download:53/0  |  Submit date:2018/07/06
双极晶体管  剂量率效应  低剂量率损伤增强效应  损伤机制  变温加速评估方法  
空间用四结键合太阳能电池子电池辐射效应研究 学位论文
硕士, 北京: 中国科学院大学, 2018
Authors:  赵晓凡
Adobe PDF(3195Kb)  |  Favorite  |  View/Download:109/0  |  Submit date:2018/07/06
四结键合太阳能电池  位移损伤  少子扩散长度  辐射效应  
CMOS图像传感器在质子辐照下产生热像素的规律与机理研究 学位论文
硕士, 北京: 中国科学院大学, 2018
Authors:  王田晖
Adobe PDF(2341Kb)  |  Favorite  |  View/Download:47/0  |  Submit date:2018/07/06
Cmos图像传感器  热像素  质子辐照  位移损伤  暗信号  
空间高能粒子对纳米器件栅介质可靠性影响的研究 学位论文
硕士, 北京: 中国科学院大学, 2018
Authors:  马腾
Adobe PDF(2664Kb)  |  Favorite  |  View/Download:37/0  |  Submit date:2018/07/06
金属氧化物半导体  辐射效应  可靠性  辐射诱导泄漏电流  介质经时击穿  
gamma-Ray Radiation Effects on an HfO2-Based Resistive Memory Device 期刊论文
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2018, 卷号: 17, 期号: 1, 页码: 61-64
Authors:  Hu, SG (Hu, Shaogang);  Liu, Y (Liu, Yang);  Chen, TP (Chen, Tupei);  Guo, Q (Guo, Qi);  Li, YD (Li, Yu-Dong);  Zhang, XY (Zhang, Xing-Yao);  Deng, LJ (Deng, L. J.);  Yu, Q (Yu, Qi);  Yin, Y (Yin, You);  Hosaka, S (Hosaka, Sumio)
Adobe PDF(1207Kb)  |  Favorite  |  View/Download:59/0  |  Submit date:2018/01/31
Gamma-ray  Hafnium Oxide  Radiation  Resistive Switching  Total Ionizing Dose  
Total ionizing dose and synergistic effects of magnetoresistive random-access memory 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2018, 卷号: 29, 期号: 8, 页码: 1-5
Authors:  Zhang, XY (Zhang, Xing-Yao);  Guo, Q (Guo, Qi);  Li, YD (Li, Yu-Dong);  Wen, L (Wen, Lin);  Zhang, XY
Adobe PDF(522Kb)  |  Favorite  |  View/Download:61/0  |  Submit date:2018/08/07
Magnetoresistive Random-access Memory Total Ionizing Dose  Synergistic Effect  
不同注量率质子辐照对CCD参数退化的影响分析 期刊论文
现代应用物理, 2018, 卷号: 9, 期号: 2, 页码: 67-70
Authors:  李豫东;  文林;  郭旗;  何承发;  周东;  冯婕;  张兴尧;  于新
Adobe PDF(727Kb)  |  Favorite  |  View/Download:42/0  |  Submit date:2018/07/24
质子  电荷耦合器件  辐射效应  注量率  缺陷  
γ射线及质子辐照导致CCD光谱响应退化的机制 期刊论文
发光学报, 2018, 卷号: 39, 期号: 2, 页码: 244-250
Authors:  文林;  李豫东;  郭旗;  汪朝敏
Adobe PDF(1365Kb)  |  Favorite  |  View/Download:66/0  |  Submit date:2018/03/13
电荷耦合器件  电离效应  位移损伤  光谱响应  
Investigation of enhanced low dose rate sensitivity in SiGe HBTs by Co-60 gamma irradiation under different biases 期刊论文
MICROELECTRONICS RELIABILITY, 2018, 卷号: 84, 期号: 5, 页码: 105-111
Authors:  Zhang, JX (Zhang, Jin-xin);  Guo, Q (Guo, Qi);  Guo, HX (Guo, Hong-xia);  Lu, W (Lu, Wu);  He, CH (He, Chao-hui);  Wang, X (Wang, Xin);  Li, P (Li, Pei);  Wen, L (Wen, Lin)
Adobe PDF(1371Kb)  |  Favorite  |  View/Download:60/0  |  Submit date:2018/06/20
Eldrs  Sige Hbt  Gamma Irradiation  Bias Conditions