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Heavy ion-induced single event effects in active pixel sensor array 期刊论文
SOLID-STATE ELECTRONICS, 2019, 卷号: 152, 期号: 2, 页码: 93-99
Authors:  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Ma, LD (Ma, Lin-Dong)[ 1,2,3 ];  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Wang, TH (Wang, Tian-Hui)[ 1,2,3 ]
Adobe PDF(1340Kb)  |  Favorite  |  View/Download:91/1  |  Submit date:2019/01/03
CMOS active pixel sensor (APS)  SEE  Heavy ion  
CMOS图像传感器在质子辐照下产生热像素的规律与机理研究 学位论文
硕士, 北京: 中国科学院大学, 2018
Authors:  王田晖
Adobe PDF(2341Kb)  |  Favorite  |  View/Download:47/0  |  Submit date:2018/07/06
Cmos图像传感器  热像素  质子辐照  位移损伤  暗信号  
不同偏置状态下4T-CMOS图像传感器的总剂量辐射效应 期刊论文
红外与激光工程, 2018, 卷号: 47, 期号: 10, 页码: 316-320
Authors:  马林东;  李豫东;  郭旗;  文林;  周东;  冯婕
Adobe PDF(377Kb)  |  Favorite  |  View/Download:55/0  |  Submit date:2018/11/19
Cmos有源像素传感器  总剂量效应  暗电流  
Total ionizing dose effects in pinned photodiode complementary metal-oxide-semiconductor transistor active pixel sensor 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-5
Authors:  Ma, LD (Ma, Lin-Dong)[ 1,2,3 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Wang, TH (Wang, Tian-Hui)[ 1,2,3 ];  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Wang, ZM (Wang, Zhi-Ming)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ]
Adobe PDF(567Kb)  |  Favorite  |  View/Download:43/0  |  Submit date:2018/11/20
Cmos Active Pixel Sensor  Dark Current  Quantum Efficiency  
行间转移电荷耦合器件位移损伤效应测试表征技术研究 学位论文
硕士, 北京: 中国科学院大学, 2017
Authors:  刘元
Adobe PDF(1699Kb)  |  Favorite  |  View/Download:36/0  |  Submit date:2017/09/26
电荷耦合器件  辐射损伤  位移损伤效应  温度效应  热像素  
Analysis of proton and gamma-ray radiation effects on CMOS active pixel sensors 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 11, 页码: 1-5
Authors:  Ma, LD (Ma, Lindong);  Li, YD (Li, Yudong);  Guo, Q (Guo, Qi);  Wen, L (Wen, Lin);  Zhou, D (Zhou, Dong);  Feng, J (Feng, Jie);  Liu, Y (Liu, Yuan);  Zeng, JZ (Zeng, Junzhe);  Zhang, X (Zhang, Xiang);  Wang, TH (Wang, Tianhui)
Adobe PDF(705Kb)  |  Favorite  |  View/Download:18/0  |  Submit date:2018/01/08
Complementary Metal-oxide-semiconductor (Cmos) Active Pixel Sensor  Dark Current  Fixed-pattern Noise  Quantum Efficiency  
CMOS有源像素图像传感器的电子辐照损伤效应研究 期刊论文
发光学报, 2017, 卷号: 38, 期号: 2, 页码: 182-187
Authors:  玛丽娅;  李豫东;  郭旗;  刘昌举;  文林;  汪波
Adobe PDF(599Kb)  |  Favorite  |  View/Download:107/1  |  Submit date:2017/02/23
电子辐照  Cmos有源像素传感器  暗信号  
3T和4T-CMOS图像传感器空间辐射效应及损伤机理研究 学位论文
博士, 北京: 中国科学院大学, 2016
Authors:  汪波
Adobe PDF(3966Kb)  |  Favorite  |  View/Download:666/0  |  Submit date:2016/09/27
Cmos图像传感器  钳位光电二极管  电离总剂量效应  位移损伤效应  抗辐射加固  
CMOS图像传感器辐射效应的测试技术 学位论文
硕士, 北京: 中国科学院大学, 2016
Authors:  王帆
Adobe PDF(2290Kb)  |  Favorite  |  View/Download:278/0  |  Submit date:2016/09/27
Cmos图像传感器  测试方法  辐射效应  电离总剂量效应  位移损伤效应  Rts噪声  
Total ionizing dose radiation effects in foue-transistor complementary metal oxide semiconductor image sensors 期刊论文
ACTA PHYSICA SINICA, 2016, 卷号: 65, 期号: 2, 页码: 180-185
Authors:  Wang, F (Wang Fan);  Li, YD (Li Yu-Dong);  Guo, Q (Guo Qi);  Wang, B (Wang Bo);  Zhang, XY (Zhang Xing-Yao);  Wen, L (Wen Lin);  He, CF (He Cheng-Fa)
Adobe PDF(455Kb)  |  Favorite  |  View/Download:85/0  |  Submit date:2016/12/13
Complementary Metal Oxide Semiconductor Image Sensor  Total Ionizing Dose Radiation Effect  Pinned Photodiode  Full Well Chargecapacity