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高总剂量水平双极器件剂量率效应及加速评估试验方法的研究 学位论文
博士, 北京: 中国科学院大学, 2018
Authors:  李小龙
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双极晶体管  剂量率效应  低剂量率损伤增强效应  损伤机制  变温加速评估方法  
高强度、多孔海藻酸钠/粘土复合水凝胶和水凝胶膜的制备及其对铅离子的吸附性能研究 学位论文
硕士, 北京: 中国科学院大学, 2018
Authors:  毛辛有
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重金属  吸附  水凝胶  水凝胶膜  粘土  
LiMgPO4:Re3+ 材料的制备及其在辐射剂量测量方面的应用 学位论文
硕士, 北京: 中国科学院大学, 2018
Authors:  孔熙瑞
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Limgpo4  稀土元素:光激励发光  辐射检测  
基于钴源辐照的光释光测年方法研究 期刊论文
科技视界, 2018, 期号: 11, 页码: 91-93
Authors:  邹德洋;  何承发;  陆妩;  张峰;  葛本伟
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钴源  光释光测年  石英  能量沉积  
gamma-Ray Radiation Effects on an HfO2-Based Resistive Memory Device 期刊论文
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2018, 卷号: 17, 期号: 1, 页码: 61-64
Authors:  Hu, SG (Hu, Shaogang);  Liu, Y (Liu, Yang);  Chen, TP (Chen, Tupei);  Guo, Q (Guo, Qi);  Li, YD (Li, Yu-Dong);  Zhang, XY (Zhang, Xing-Yao);  Deng, LJ (Deng, L. J.);  Yu, Q (Yu, Qi);  Yin, Y (Yin, You);  Hosaka, S (Hosaka, Sumio)
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Gamma-ray  Hafnium Oxide  Radiation  Resistive Switching  Total Ionizing Dose  
Total ionizing dose and synergistic effects of magnetoresistive random-access memory 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2018, 卷号: 29, 期号: 8, 页码: 1-5
Authors:  Zhang, XY (Zhang, Xing-Yao);  Guo, Q (Guo, Qi);  Li, YD (Li, Yu-Dong);  Wen, L (Wen, Lin);  Zhang, XY
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Magnetoresistive Random-access Memory Total Ionizing Dose  Synergistic Effect  
γ射线及质子辐照导致CCD光谱响应退化的机制 期刊论文
发光学报, 2018, 卷号: 39, 期号: 2, 页码: 244-250
Authors:  文林;  李豫东;  郭旗;  汪朝敏
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电荷耦合器件  电离效应  位移损伤  光谱响应  
Investigation of enhanced low dose rate sensitivity in SiGe HBTs by Co-60 gamma irradiation under different biases 期刊论文
MICROELECTRONICS RELIABILITY, 2018, 卷号: 84, 期号: 5, 页码: 105-111
Authors:  Zhang, JX (Zhang, Jin-xin);  Guo, Q (Guo, Qi);  Guo, HX (Guo, Hong-xia);  Lu, W (Lu, Wu);  He, CH (He, Chao-hui);  Wang, X (Wang, Xin);  Li, P (Li, Pei);  Wen, L (Wen, Lin)
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Eldrs  Sige Hbt  Gamma Irradiation  Bias Conditions  
Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 3, 页码: 1-9
Authors:  Li, XL (Li, Xiao-Long);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Yu, X (Yu, Xin);  Guo, Q (Guo, Qi);  Sun, J (Sun, Jing);  Liu, MH (Liu, Mo-Han);  Yao, S (Yao, Shuai);  Wei, XY (Wei, Xin-Yu);  He, CF (He, Cheng-Fa)
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Ionizing Radiation Damage  Enhanced Low Dose Rate Sensitivity (Eldrs)  Switched Temperature Irradiation  Gate-controlled Lateral Pnp Transistor (glPnp)  
Using temperature-switching approach to evaluate the ELDRS of bipolar devices 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2018, 卷号: 172, 期号: 11-12, 页码: 824-834
Authors:  Li, XL (Li, Xiaolong);  Lu, W (Lu, Wu);  Wang, X (Wang, Xin);  Guo, Q (Guo, Qi);  Yu, X (Yu, Xin);  He, CF (He, Chengfa);  Sun, J (Sun, Jing);  Liu, MH (Liu, Mohan);  Yao, S (Yao, Shuai);  Wei, XY (Wei, Xinyu)查看 ResearcherID 和 ORCID
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Bipolar Technology  Co-60 Gamma Irradiation  Enhanced Low-dose Rate Sensitivity (Eldrs)  Temperature-switching Approach (Tsa)