Radiation Effects Due to 3 MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors
Zhang, X (Zhang, Xiang); Li, YD (Li, Yu-Dong); Wen, L (Wen, Lin); Zhou, D (Zhou, Dong); Feng, J (Feng, Jie); Ma, LD (Ma, Lin-Dong); Wang, TH (Wang, Tian-Hui); Cai, YL (Cai, Yu-Long); Wang, ZM (Wang, Zhi-Ming); Guo, Q (Guo, Qi); Guo, Q
2018
发表期刊CHINESE PHYSICS LETTERS
卷号35期号:7
摘要

Benefitting from the higher quantum efficiency and sensitivity compared with the front-side illumination (FSI) CMOS image sensors (CISs), backside illumination (BSI) CMOS image sensors tend to replace CCDs and FSI CISs for space applications. However, the radiation damage effects and mechanisms of BSI CISs in the radiation environment are not well understood. We provide radiation effects due to 3 MeV proton irradiations of BSI CISs dedicated to imaging by the analyses of mean dark current increase, dark current nonuniformity and full well capacity in pixel arrays and isolated photodiodes. Additionally, the present annealing certifies the radiation-induced defects, which are responsible for the parameter degradations in BSI CISs.

DOI10.1088/0256-307X/35/7/074201
收录类别SCI
WOS记录号WOS:000439269700008
引用统计
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/5526
专题中国科学院特殊环境功能材料与器件重点试验室
通讯作者Guo, Q
作者单位1.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China
2.Xinjiang Key Lab Elect Informat Mat & Devices, Urumqi 830011, Peoples R China
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
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Zhang, X ,Li, YD ,Wen, L ,et al. Radiation Effects Due to 3 MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors[J]. CHINESE PHYSICS LETTERS,2018,35(7).
APA Zhang, X .,Li, YD .,Wen, L .,Zhou, D .,Feng, J .,...&Guo, Q.(2018).Radiation Effects Due to 3 MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors.CHINESE PHYSICS LETTERS,35(7).
MLA Zhang, X ,et al."Radiation Effects Due to 3 MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors".CHINESE PHYSICS LETTERS 35.7(2018).
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