Using temperature-switching approach to evaluate the ELDRS of bipolar devices
Li, XL (Li, Xiaolong); Lu, W (Lu, Wu); Wang, X (Wang, Xin); Guo, Q (Guo, Qi); Yu, X (Yu, Xin); He, CF (He, Chengfa); Sun, J (Sun, Jing); Liu, MH (Liu, Mohan); Yao, S (Yao, Shuai); Wei, XY (Wei, Xinyu)查看 ResearcherID 和 ORCID
2018
Source PublicationRADIATION EFFECTS AND DEFECTS IN SOLIDS
ISSN1042-0150
Volume172Issue:11-12Pages:824-834
Abstract

Enhanced low-dose rate sensitivity (ELDRS) exhibited at low-dose rates (LDRs) by most bipolar devices is considered as one of the main concerns for spacecraft reliability. In this work, a time-saving and conservative approach - temperature-switching approach (TSA) - to simulate the ELDRS of bipolar devices is presented. Good agreement is observed between the predictive curve obtained with the TSA and the LDR data, and TSA provides us with a new insight into the test technique for ELDRS. Additionally, the mechanisms of TSA are analyzed in this paper.

KeywordBipolar Technology Co-60 Gamma Irradiation Enhanced Low-dose Rate Sensitivity (Eldrs) Temperature-switching Approach (Tsa)
DOI10.1080/10420150.2017.1411354
Indexed BySCI
WOS IDWOS:000423771100003
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/5501
Collection中国科学院特殊环境功能材料与器件重点试验室
材料物理与化学研究室
Corresponding AuthorLu, W (Lu, Wu)
Affiliation1.Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Urumqi, Peoples R China
2.Xinjiang Tech Inst Phys & Chem, Xinjiang Key Lab Elect Informat Mat & Device, Urumqi, Peoples R China
3.Univ Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Beijing, Peoples R China
Recommended Citation
GB/T 7714
Li, XL ,Lu, W ,Wang, X ,et al. Using temperature-switching approach to evaluate the ELDRS of bipolar devices[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS,2018,172(11-12):824-834.
APA Li, XL .,Lu, W .,Wang, X .,Guo, Q .,Yu, X .,...&Wei, XY .(2018).Using temperature-switching approach to evaluate the ELDRS of bipolar devices.RADIATION EFFECTS AND DEFECTS IN SOLIDS,172(11-12),824-834.
MLA Li, XL ,et al."Using temperature-switching approach to evaluate the ELDRS of bipolar devices".RADIATION EFFECTS AND DEFECTS IN SOLIDS 172.11-12(2018):824-834.
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