Using temperature-switching approach to evaluate the ELDRS of bipolar devices
Li, XL (Li, Xiaolong); Lu, W (Lu, Wu); Wang, X (Wang, Xin); Guo, Q (Guo, Qi); Yu, X (Yu, Xin); He, CF (He, Chengfa); Sun, J (Sun, Jing); Liu, MH (Liu, Mohan); Yao, S (Yao, Shuai); Wei, XY (Wei, Xinyu)查看 ResearcherID 和 ORCID
2018
发表期刊RADIATION EFFECTS AND DEFECTS IN SOLIDS
ISSN1042-0150
卷号172期号:11-12页码:824-834
摘要

Enhanced low-dose rate sensitivity (ELDRS) exhibited at low-dose rates (LDRs) by most bipolar devices is considered as one of the main concerns for spacecraft reliability. In this work, a time-saving and conservative approach - temperature-switching approach (TSA) - to simulate the ELDRS of bipolar devices is presented. Good agreement is observed between the predictive curve obtained with the TSA and the LDR data, and TSA provides us with a new insight into the test technique for ELDRS. Additionally, the mechanisms of TSA are analyzed in this paper.

关键词Bipolar Technology Co-60 Gamma Irradiation Enhanced Low-dose Rate Sensitivity (Eldrs) Temperature-switching Approach (Tsa)
DOI10.1080/10420150.2017.1411354
收录类别SCI
WOS记录号WOS:000423771100003
引用统计
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/5501
专题中国科学院特殊环境功能材料与器件重点试验室
材料物理与化学研究室
通讯作者Lu, W (Lu, Wu)
作者单位1.Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Urumqi, Peoples R China
2.Xinjiang Tech Inst Phys & Chem, Xinjiang Key Lab Elect Informat Mat & Device, Urumqi, Peoples R China
3.Univ Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Beijing, Peoples R China
推荐引用方式
GB/T 7714
Li, XL ,Lu, W ,Wang, X ,et al. Using temperature-switching approach to evaluate the ELDRS of bipolar devices[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS,2018,172(11-12):824-834.
APA Li, XL .,Lu, W .,Wang, X .,Guo, Q .,Yu, X .,...&Wei, XY .(2018).Using temperature-switching approach to evaluate the ELDRS of bipolar devices.RADIATION EFFECTS AND DEFECTS IN SOLIDS,172(11-12),824-834.
MLA Li, XL ,et al."Using temperature-switching approach to evaluate the ELDRS of bipolar devices".RADIATION EFFECTS AND DEFECTS IN SOLIDS 172.11-12(2018):824-834.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
Using temperature-sw(1644KB)期刊论文作者接受稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Li, XL (Li, Xiaolong)]的文章
[Lu, W (Lu, Wu)]的文章
[Wang, X (Wang, Xin)]的文章
百度学术
百度学术中相似的文章
[Li, XL (Li, Xiaolong)]的文章
[Lu, W (Lu, Wu)]的文章
[Wang, X (Wang, Xin)]的文章
必应学术
必应学术中相似的文章
[Li, XL (Li, Xiaolong)]的文章
[Lu, W (Lu, Wu)]的文章
[Wang, X (Wang, Xin)]的文章
相关权益政策
暂无数据
收藏/分享
文件名: Using temperature-switching approach to evaluate the ELDRS of bipolar devices.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。