An Increase in TDDB Lifetime of Partially Depleted SOI Devices Induced by Proton Irradiation
Ma, T (Ma, Teng); Zheng, QW (Zheng, Qi-Wen); Cui, JW (Cui, Jiang-Wei); Zhou, H (Zhou, Hang); Su, DD (Su, Dan-Dan); Yu, XF (Yu, Xue-Feng); Guo, Q (Guo, Qi)
2017
发表期刊CHINESE PHYSICS LETTERS
ISSN0256-307X
卷号34期号:7页码:181-184
摘要

The effects of proton irradiation on the subsequent time-dependent dielectric breakdown (TDDB) of partially depleted SOI devices are experimentally investigated. It is demonstrated that heavy-ion irradiation will induce the decrease of TDDB lifetime for many device types, but we are amazed to find a measurable increase in the TDDB lifetime and a slight decrease in the radiation-induced leakage current after proton irradiation at the nominal operating irradiation bias. We interpret these results and mechanisms in terms of the effects of radiation-induced traps on the stressing current during the reliability testing, which may be significant to expand the understanding of the radiation effects of the devices used in the proton radiation environment.

DOI10.1088/0256-307X/34/7/076104
收录类别SCI
WOS记录号WOS:000410696400040
引用统计
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/5058
专题中国科学院特殊环境功能材料与器件重点试验室
材料物理与化学研究室
通讯作者Yu, XF (Yu, Xue-Feng)
作者单位1.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China
2.Xinjiang Key Lab Elect Informat Mat & Device, Urumqi 830011, Peoples R China
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Ma, T ,Zheng, QW ,Cui, JW ,et al. An Increase in TDDB Lifetime of Partially Depleted SOI Devices Induced by Proton Irradiation[J]. CHINESE PHYSICS LETTERS,2017,34(7):181-184.
APA Ma, T .,Zheng, QW .,Cui, JW .,Zhou, H .,Su, DD .,...&Guo, Q .(2017).An Increase in TDDB Lifetime of Partially Depleted SOI Devices Induced by Proton Irradiation.CHINESE PHYSICS LETTERS,34(7),181-184.
MLA Ma, T ,et al."An Increase in TDDB Lifetime of Partially Depleted SOI Devices Induced by Proton Irradiation".CHINESE PHYSICS LETTERS 34.7(2017):181-184.
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