Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films
Wang, HG (Wang, Hongguang)1; Xiong, XQ (Xiong, Xinqian)1; Xu, JB (Xu, Jinbao)1; Wang, L (Wang, Lei)1; Bian, L (Bian, Liang)1; Ren, W (Ren, Wei)1; Chang, AM (Chang, Aimin)1
2015
Source PublicationJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN0957-4522
Volume26Issue:1Pages:369-376
Abstract

Preferred (100)-oriented and complete (100)-oriented LaMn0.6Al0.4O3 thin films were deposited on (100)-LaNiO3-coated silicon substrates by spin-coating method. Complex impedance spectroscopy was used to provide a convincing evidence for the existence of grain and grain boundary that were separated in the frequency domain in impedance spectrum. It suggests that the better grain orientation is effective in lowering the resistivity and activation energy but with little influenced on grain boundary. The analysis of impedance dependent on frequency, reveals that the relaxation is a thermally activation process. The grain and grain boundary conduction obey the Arrhenius behavior with activation energy 1.2294-1.3273 eV. The mechanism associated with the change of the electrical properties of the thin films is discussed.

DOI10.1007/s10854-014-2409-x
Indexed BySCI
WOS IDWOS:000347697500052
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Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/4886
Collection中国科学院特殊环境功能材料与器件重点试验室
材料物理与化学研究室
Corresponding AuthorXu, JB (Xu, Jinbao)
Affiliation1.Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
Recommended Citation
GB/T 7714
Wang, HG ,Xiong, XQ ,Xu, JB ,et al. Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2015,26(1):369-376.
APA Wang, HG .,Xiong, XQ .,Xu, JB .,Wang, L .,Bian, L .,...&Chang, AM .(2015).Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,26(1),369-376.
MLA Wang, HG ,et al."Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 26.1(2015):369-376.
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