Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films
Wang, HG (Wang, Hongguang)1; Xiong, XQ (Xiong, Xinqian)1; Xu, JB (Xu, Jinbao)1; Wang, L (Wang, Lei)1; Bian, L (Bian, Liang)1; Ren, W (Ren, Wei)1; Chang, AM (Chang, Aimin)1; Xu, JB
2015
发表期刊JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
卷号26期号:1页码:369-376
摘要Preferred (100)-oriented and complete (100)-oriented LaMn0.6Al0.4O3 thin films were deposited on (100)-LaNiO3-coated silicon substrates by spin-coating method. Complex impedance spectroscopy was used to provide a convincing evidence for the existence of grain and grain boundary that were separated in the frequency domain in impedance spectrum. It suggests that the better grain orientation is effective in lowering the resistivity and activation energy but with little influenced on grain boundary. The analysis of impedance dependent on frequency, reveals that the relaxation is a thermally activation process. The grain and grain boundary conduction obey the Arrhenius behavior with activation energy 1.2294-1.3273 eV. The mechanism associated with the change of the electrical properties of the thin films is discussed.
DOI10.1007/s10854-014-2409-x
收录类别SCI
WOS记录号WOS:000347697500052
引用统计
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/4886
专题中国科学院特殊环境功能材料与器件重点试验室
通讯作者Xu, JB
作者单位1.Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Wang, HG ,Xiong, XQ ,Xu, JB ,et al. Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2015,26(1):369-376.
APA Wang, HG .,Xiong, XQ .,Xu, JB .,Wang, L .,Bian, L .,...&Xu, JB.(2015).Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,26(1),369-376.
MLA Wang, HG ,et al."Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 26.1(2015):369-376.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
Complex impedance an(2473KB)期刊论文作者接受稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Wang, HG (Wang, Hongguang)]的文章
[Xiong, XQ (Xiong, Xinqian)]的文章
[Xu, JB (Xu, Jinbao)]的文章
百度学术
百度学术中相似的文章
[Wang, HG (Wang, Hongguang)]的文章
[Xiong, XQ (Xiong, Xinqian)]的文章
[Xu, JB (Xu, Jinbao)]的文章
必应学术
必应学术中相似的文章
[Wang, HG (Wang, Hongguang)]的文章
[Xiong, XQ (Xiong, Xinqian)]的文章
[Xu, JB (Xu, Jinbao)]的文章
相关权益政策
暂无数据
收藏/分享
文件名: Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films.pdf
格式: Adobe PDF
此文件暂不支持浏览
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。