XJIPC OpenIR  > 材料物理与化学研究室
An Investigation of ELDRS in Different SiGe Processes
Li, P (Li, Pei); He, CH (He, Chaohui); Guo, HX (Guo, Hongxia); Guo, Q (Guo, Qi); Zhang, JX (Zhang, Jinxin); Liu, MH (Liu, Mohan)
2017
Source PublicationIEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN0018-9499
Volume64Issue:5Pages:1137-1141
Abstract

Enhanced low dose rate sensitivity (ELDRS) in different process Silicon-Germanium heterojunction bipolar transistors (SiGe HBTs) is investigated. Low and high dose rate irradiations are performed to evaluate the ELDRS of SiGe HBTs manufactured by Tsinghua University (THU). THU SiGe HBTs experience significantly low dose rate sensitivity than that of IBM 8HP SiGe HBTs and behave a "true" dose rate effect. TCAD models were used to explicate the microcosmic structure in THU and IBM 8HP SiGe HBTs. Comparison and discussion show that different SiGe processes may involve different HBT structures and device designs which are the critical influence of ELDRS effect. The different responses of ELDRS should be first attributed to the device structure and design in nature, particularly the geometry of emitter-base junction and the isolation structure.

KeywordDifferent Silicon-germanium (Sige) Process Emitter-base (Eb)-spacer Geometry Enhanced Low Dose Rate Sensitivity (Eldrs) Isolation Structure
DOI10.1109/TNS.2017.2686429
Indexed BySCI
WOS IDWOS:000401949800005
Citation statistics
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/4816
Collection材料物理与化学研究室
AffiliationXi An Jiao Tong Univ, Xian 710049, Peoples R China; Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China; Northwest Inst Nucl Technol, Xian 710024, Peoples R China
Recommended Citation
GB/T 7714
Li, P ,He, CH ,Guo, HX ,et al. An Investigation of ELDRS in Different SiGe Processes[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2017,64(5):1137-1141.
APA Li, P ,He, CH ,Guo, HX ,Guo, Q ,Zhang, JX ,&Liu, MH .(2017).An Investigation of ELDRS in Different SiGe Processes.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,64(5),1137-1141.
MLA Li, P ,et al."An Investigation of ELDRS in Different SiGe Processes".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 64.5(2017):1137-1141.
Files in This Item:
File Name/Size DocType Version Access License
An Investigation of (386KB)期刊论文作者接受稿开放获取CC BY-NC-SAView Application Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Li, P (Li, Pei)]'s Articles
[He, CH (He, Chaohui)]'s Articles
[Guo, HX (Guo, Hongxia)]'s Articles
Baidu academic
Similar articles in Baidu academic
[Li, P (Li, Pei)]'s Articles
[He, CH (He, Chaohui)]'s Articles
[Guo, HX (Guo, Hongxia)]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Li, P (Li, Pei)]'s Articles
[He, CH (He, Chaohui)]'s Articles
[Guo, HX (Guo, Hongxia)]'s Articles
Terms of Use
No data!
Social Bookmark/Share
File name: An Investigation of ELDRS in Different SiGe Processes.pdf
Format: Adobe PDF
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.