Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors
Zheng, QW (Zheng, Qi-Wen); Cui, JW (Cui, Jiang-Wei); Zhou, H (Zhou, Hang); Yu, DZ (Yu, De-Zhao); Yu, XF (Yu, Xue-Feng); Guo, Q (Guo, Qi)
2016
发表期刊CHINESE PHYSICS LETTERS
卷号33期号:7
摘要The influence of total dose irradiation on hot-carrier reliability of 65 nm n-type metal-oxide-semiconductor field-effect transistors (nMOSFETs) is investigated. Experimental results show that hot-carrier degradations on irradiated narrow channel nMOSFETs are greater than those without irradiation. The reason is attributed to radiation-induced charge trapping in shallow trench isolation (STI). The electric field in the pinch-off region of the nMOSFET is enhanced by radiation-induced charge trapping in STI, resulting in a more severe hot-carrier effect.
DOI10.1088/0256-307X/33/7/076102
收录类别SCI
WOS记录号WOS:000379260700029
引用统计
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/4651
专题中国科学院特殊环境功能材料与器件重点试验室
作者单位Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China
推荐引用方式
GB/T 7714
Zheng, QW ,Cui, JW ,Zhou, H ,et al. Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors[J]. CHINESE PHYSICS LETTERS,2016,33(7).
APA Zheng, QW ,Cui, JW ,Zhou, H ,Yu, DZ ,Yu, XF ,&Guo, Q .(2016).Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors.CHINESE PHYSICS LETTERS,33(7).
MLA Zheng, QW ,et al."Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors".CHINESE PHYSICS LETTERS 33.7(2016).
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
Hot-Carrier Effects (414KB)期刊论文作者接受稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Zheng, QW (Zheng, Qi-Wen)]的文章
[Cui, JW (Cui, Jiang-Wei)]的文章
[Zhou, H (Zhou, Hang)]的文章
百度学术
百度学术中相似的文章
[Zheng, QW (Zheng, Qi-Wen)]的文章
[Cui, JW (Cui, Jiang-Wei)]的文章
[Zhou, H (Zhou, Hang)]的文章
必应学术
必应学术中相似的文章
[Zheng, QW (Zheng, Qi-Wen)]的文章
[Cui, JW (Cui, Jiang-Wei)]的文章
[Zhou, H (Zhou, Hang)]的文章
相关权益政策
暂无数据
收藏/分享
文件名: Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors.pdf
格式: Adobe PDF
此文件暂不支持浏览
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。