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题名: Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry
作者: Ma, Chao; Wang, Hong Guang; Zhao, Peng Jun; Xu, Jin Bao; Chang, Ai Min; Wang, Lei; Bian, Liang
通讯作者: Xu, J.B.
关键词: Thin films ; Spectroscopic ellipsometry ; Temperature dependence ; Mechanism
刊名: Materials Letters
发表日期: 2014
DOI: 10.1016/j.matlet.2014.08.025
卷: 136, 期:12, 页:225-228
收录类别: SCI
摘要: The optical properties of spinel Mn1.56Co0.96Ni 0.48O4 thin films have been investigated by spectroscopic ellipsometry in the temperature range from 20 to 260 °C. By fitting the measured ellipsometric parameter data with a three-layer model by Tauc-Lorentz oscillator dispersion formula, the refractive index and extinction coefficient of the thin films are determined in the spectral range of 280-850 nm. The refractive index decreases in the short-wavelength region but increases in the long-wavelength region with increasing temperature. The extinction coefficient increases with increasing temperature in all visible region.
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内容类型: 期刊论文
URI标识: http://ir.xjipc.cas.cn/handle/365002/4190
Appears in Collections:中国科学院特殊环境功能材料与器件重点试验室_期刊论文

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作者单位: Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China;Univ Chinese Acad Sci, Beijing 100049, Peoples R China

Recommended Citation:
Ma, Chao,Wang, Hong Guang,Zhao, Peng Jun,et al. Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry[J]. Materials Letters,2014,136(12):225-228.
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文件名: Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry.pdf
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