Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry
Ma, Chao; Wang, Hong Guang; Zhao, Peng Jun; Xu, Jin Bao; Chang, Ai Min; Wang, Lei; Bian, Liang; Xu, J.B.
2014
Source PublicationMaterials Letters
ISSN0167577X
Volume136Issue:12Pages:225-228
AbstractThe optical properties of spinel Mn1.56Co0.96Ni 0.48O4 thin films have been investigated by spectroscopic ellipsometry in the temperature range from 20 to 260 °C. By fitting the measured ellipsometric parameter data with a three-layer model by Tauc-Lorentz oscillator dispersion formula, the refractive index and extinction coefficient of the thin films are determined in the spectral range of 280-850 nm. The refractive index decreases in the short-wavelength region but increases in the long-wavelength region with increasing temperature. The extinction coefficient increases with increasing temperature in all visible region.
KeywordThin Films Spectroscopic Ellipsometry Temperature Dependence Mechanism
DOI10.1016/j.matlet.2014.08.025
Indexed BySCI
WOS IDWOS:000343638700060
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Cited Times:11[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/4190
Collection中国科学院特殊环境功能材料与器件重点试验室
材料物理与化学研究室
Corresponding AuthorXu, J.B.
AffiliationChinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China;Univ Chinese Acad Sci, Beijing 100049, Peoples R China
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Ma, Chao,Wang, Hong Guang,Zhao, Peng Jun,et al. Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry[J]. Materials Letters,2014,136(12):225-228.
APA Ma, Chao.,Wang, Hong Guang.,Zhao, Peng Jun.,Xu, Jin Bao.,Chang, Ai Min.,...&Xu, J.B..(2014).Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry.Materials Letters,136(12),225-228.
MLA Ma, Chao,et al."Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry".Materials Letters 136.12(2014):225-228.
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