Phase Transformation Properties of Highly (100)-Oriented PLZST 2/85/12/3 Antiferroelectric Thin Films Deposited on Nb-SrTiO3 Single-Crystal Substrates
Hao, Xihong; Zhai, Jiwei; Yue, Zhenxing; Xu, Jinbao
2011
发表期刊Journal of the American Ceramic Society
ISSN27820
卷号94期号:9页码:2816-2818
摘要

In this work, (Pb0.97La0.02)(Zr0.85Sn 0.12Ti0.03)O3 (PLZST 2/85/12/3) antiferroelectric (AFE) thin films with a thickness of ∼700 nm were successfully fabricated on (100)-oriented Nb-SrTiO3 single crystal via a sol-gel technique. X-ray diffraction and scanning electron microscopy results showed that the obtained AFE films had a highly (100)-preferred orientation and displayed a uniform surface microstructure. Electrical measurements, such as P-E loops, the electric-field, and temperature-dependent dielectric properties, demonstrated a mixture of AFE and FE phases in PLZST 2/85/12/3 films deposited on Nb-SrTiO3 substrates.

DOI10.1111/j.1551-2916.2011.04736.x
收录类别SCI
WOS记录号WOS:000295215900025
引用统计
被引频次:5[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/3998
专题新疆维吾尔自治区电子信息材料与器件重点实验室
作者单位Tongji Univ, Funct Mat Res Lab, Shanghai 200092, Peoples R China;Inner Mongolia Univ Sci & Technol, Sch Mat & Met, Baotou 014010, Peoples R China;Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China;Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Xinjiang Key Lab Elect Informat Mat & Devices, Urumqi 830011, Peoples R China
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Hao, Xihong,Zhai, Jiwei,Yue, Zhenxing,et al. Phase Transformation Properties of Highly (100)-Oriented PLZST 2/85/12/3 Antiferroelectric Thin Films Deposited on Nb-SrTiO3 Single-Crystal Substrates[J]. Journal of the American Ceramic Society,2011,94(9):2816-2818.
APA Hao, Xihong,Zhai, Jiwei,Yue, Zhenxing,&Xu, Jinbao.(2011).Phase Transformation Properties of Highly (100)-Oriented PLZST 2/85/12/3 Antiferroelectric Thin Films Deposited on Nb-SrTiO3 Single-Crystal Substrates.Journal of the American Ceramic Society,94(9),2816-2818.
MLA Hao, Xihong,et al."Phase Transformation Properties of Highly (100)-Oriented PLZST 2/85/12/3 Antiferroelectric Thin Films Deposited on Nb-SrTiO3 Single-Crystal Substrates".Journal of the American Ceramic Society 94.9(2011):2816-2818.
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