Thermodynamic impact on total dose effect for semiconductor components
Cong, Zhong-Chao; Yu, Xue-Feng; Cui, Jiang-Wei; Zheng, Qi-Wen; Guo, Qi; Sun, Jing; Zhou, Hang; Yu, X.-F
2014
发表期刊Faguang Xuebao/Chinese Journal of Luminescence
ISSN10007032
卷号35期号:4页码:465-469
摘要The total dose irradiation experiments were conducted on commercial triodes and MOS transistors. The impacts of different radiation temperature on the radiation effect were compared when the other conditions were identical. For the same total dose, the base current and current gain of the triode, and the threshold voltage of the MOS transistor exist a big discrepancy according to the different radiation temperature. When the total dose is 100 krad(Si) and the radiation temperature is 25, 70, 100°C, the current gain reduction of the NPN triode is 71, 89, 113, and the threshold voltage degradation of the NMOS transistor is 3.53, 2.8, 2.82 V, respectively.
收录类别EI
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/3930
专题中国科学院特殊环境功能材料与器件重点试验室
通讯作者Yu, X.-F
作者单位Key Laboratory of Special Materials and Devices, The Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China ;Xinjiang Key Laboratory of Electronic Information Materials and Devices, Urumqi 830011, China;University of Chinese Academy of Sciences, Beijing 100049, China
推荐引用方式
GB/T 7714
Cong, Zhong-Chao,Yu, Xue-Feng,Cui, Jiang-Wei,et al. Thermodynamic impact on total dose effect for semiconductor components[J]. Faguang Xuebao/Chinese Journal of Luminescence,2014,35(4):465-469.
APA Cong, Zhong-Chao.,Yu, Xue-Feng.,Cui, Jiang-Wei.,Zheng, Qi-Wen.,Guo, Qi.,...&Yu, X.-F.(2014).Thermodynamic impact on total dose effect for semiconductor components.Faguang Xuebao/Chinese Journal of Luminescence,35(4),465-469.
MLA Cong, Zhong-Chao,et al."Thermodynamic impact on total dose effect for semiconductor components".Faguang Xuebao/Chinese Journal of Luminescence 35.4(2014):465-469.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
半导体器件总剂量辐射效应的热力学影响.p(448KB)期刊论文作者接受稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Cong, Zhong-Chao]的文章
[Yu, Xue-Feng]的文章
[Cui, Jiang-Wei]的文章
百度学术
百度学术中相似的文章
[Cong, Zhong-Chao]的文章
[Yu, Xue-Feng]的文章
[Cui, Jiang-Wei]的文章
必应学术
必应学术中相似的文章
[Cong, Zhong-Chao]的文章
[Yu, Xue-Feng]的文章
[Cui, Jiang-Wei]的文章
相关权益政策
暂无数据
收藏/分享
文件名: 半导体器件总剂量辐射效应的热力学影响.pdf
格式: Adobe PDF
此文件暂不支持浏览
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。