Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation
Zheng, Qi-Wen; Yu, Xue-Feng; Cui, Jiang-Wei; Guo, Qi; Ren, Di-Yuan; Cong, Zhong-Chao; Zhou, Hang
2014
Source PublicationChinese Physics B
ISSN1674-1056
Volume23Issue:10Pages:366-372
Abstract

Pattern imprinting in deep sub-micron static random access memories (SRAMs) during total dose irradiation is investigated in detail. As the dose accumulates, the data pattern of memory cells loading during irradiation is gradually imprinted on their background data pattern. We build a relationship between the memory cell's static noise margin (SNM) and the background data, and study the influence of irradiation on the probability density function of ΔSNM, which is the difference between two data sides' SNMs, to discuss the reason for pattern imprinting. Finally, we demonstrate that, for micron and deep sub-micron devices, the mechanism of pattern imprinting is the bias-dependent threshold shift of the transistor, but for a deep sub-micron device the shift results from charge trapping in the shallow trench isolation (STI) oxide rather than from the gate oxide of the micron-device.

KeywordTotal Dose Irradiation Static Random Access Memory Pattern Imprinting Deep Sub-micron
DOI10.1088/1674-1056/23/10/106102
Indexed BySCI
WOS IDWOS:000344057600057
Citation statistics
Cited Times:5[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/3927
Collection中国科学院特殊环境功能材料与器件重点试验室
材料物理与化学研究室
Corresponding AuthorYu, Xue-Feng
Affiliation1.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China
2.Xinjiang Key Lab Elect Informat Mat & Device, Urumqi 830011, Peoples R China
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
Recommended Citation
GB/T 7714
Zheng, Qi-Wen,Yu, Xue-Feng,Cui, Jiang-Wei,et al. Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation[J]. Chinese Physics B,2014,23(10):366-372.
APA Zheng, Qi-Wen.,Yu, Xue-Feng.,Cui, Jiang-Wei.,Guo, Qi.,Ren, Di-Yuan.,...&Zhou, Hang.(2014).Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation.Chinese Physics B,23(10),366-372.
MLA Zheng, Qi-Wen,et al."Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation".Chinese Physics B 23.10(2014):366-372.
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