Research on dark signal degradation in Co-60 gamma-ray-irradiated CMOS active pixel sensor
Wang Bo; Li Yu-Dong; Guo Qi; Liu Chang-Ju; Wen Lin; Ma Li-Ya; Sun Jing; Wang Hai-Jiao; Cong Zhong-Chao; Ma Wu-Ying
2014
发表期刊ACTA PHYSICA SINICA
ISSN1000-3290
卷号63期号:5
摘要A study of ionizing radiation effects is presented for CMOS active pixel sensors manufactured in a 0.5-mu m CMOS (complementary metal oxide semiconductor) by n-well technology. The basic mechanisms that may cause failure are also presented. After exposure in gamma-rays, the most sensitive parts to radiation-dark signals and dark signal non-uniformity are discussed, i.e. the physical mechanism of the degradation by irradiation. One can see from the experiment that the mean dark signals are dramatically increased with total dose for both operated and static devices. Static device seems more affected by irradiation than operated device. We find that most part of the total dark signal in a pixel comes from the depletion of the photodiode edge at the surface and the rest part is caused by the leakage of the source region of the reset transistor. Dark signal non-uniformity follows the dark current evolution with total dose. Further study of photodiode and LOCOS (local oxidation of silicon) isolation behaviors under irradiation should be done so as to correctly use this qualification techniques on MOS sensors manufactured in CMOS n-well technology process.
关键词Cmos Aps Dark Signal Co-60 Gamma-rays Damage Mechanism
DOI10.7498/aps.63.056102
收录类别SCI
WOS记录号WOS:000335388200039
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被引频次:3[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/3801
专题中国科学院特殊环境功能材料与器件重点试验室
作者单位Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China;Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China;Xinjiang Key Lab Elect Informat Mat & Devices, Urumqi 830011, Peoples R China;Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China;Chongqing Optoelect Res Inst, Chongqing 400060, Peoples R China
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Wang Bo,Li Yu-Dong,Guo Qi,et al. Research on dark signal degradation in Co-60 gamma-ray-irradiated CMOS active pixel sensor[J]. ACTA PHYSICA SINICA,2014,63(5).
APA Wang Bo.,Li Yu-Dong.,Guo Qi.,Liu Chang-Ju.,Wen Lin.,...&Ma Wu-Ying.(2014).Research on dark signal degradation in Co-60 gamma-ray-irradiated CMOS active pixel sensor.ACTA PHYSICA SINICA,63(5).
MLA Wang Bo,et al."Research on dark signal degradation in Co-60 gamma-ray-irradiated CMOS active pixel sensor".ACTA PHYSICA SINICA 63.5(2014).
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