Epitaxial growth of Mn-Co-Ni-O thin films and thickness effects on the electrical properties
Ji, Guang; Chang, Aimin; Li, Hongyi; Xie, Yahong; Zhang, Huimin; Kong, Wenwen
2014
Source PublicationMaterials Letters
ISSN0167-577X
Volume130Issue:9Pages:127-130
Abstract

Mn1.56Co0.96Ni0.48O4 (MCN) thin films were grown on thermally oxidized Si(1 0 0) substrates using laser molecular beam epitaxy technique. The X-ray diffraction and high-resolution transmission electron microscopy analyses indicated an epitaxial structure with [1 0 0] growth direction and a lattice parameter of 8.28 A˚. The resistivity-temperature relationships of the epitaxial MCN thin films exhibited negative temperature coefficient thermistor characteristics, and the electron conduction mechanism was found to be nearest-neighbor hopping. Interestingly, the room temperature resistivity ρ25, the characteristic temperature T0, the activation energy Ea, and the temperature coefficient of resistance αT were all highly dependent on the film thickness t, and as t increased all of them decreased. An approximately linear relation was further revealed between ρ25 and 1/t2, which could be approximately expressed as ρ25(t)=211.7+119.1×104/t2 (t in nm; ρ25 in Ω cm). The successful growth of epitaxial MCN thin films opens a door for studying the effects of thickness on the electrical properties of MCN thin films, and may consequently provide an alternative approach for controlling the properties.

KeywordThin Films Epitaxial Growth Electrical Properties Negative Temperature Coefficient Thermistor Thickness Effects
DOI10.1016/j.matlet.2014.05.091
Indexed BySCI
WOS IDWOS:000338804300035
Citation statistics
Cited Times:16[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/3746
Collection中国科学院特殊环境功能材料与器件重点试验室
材料物理与化学研究室
Corresponding AuthorChang, Aimin
Affiliation1.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Urumqi 830011, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
3.Qual Prod Supervis & Inspect Inst Technol, Urumqi 830011, Xinjiang Uygur, Peoples R China
4.Xinjiang Univ, Key Lab Oil & Gas Fine Chem, Minist Educ & Xinjiang Uyghur Autonomous Reg, Urumqi 830046, Peoples R China
Recommended Citation
GB/T 7714
Ji, Guang,Chang, Aimin,Li, Hongyi,et al. Epitaxial growth of Mn-Co-Ni-O thin films and thickness effects on the electrical properties[J]. Materials Letters,2014,130(9):127-130.
APA Ji, Guang,Chang, Aimin,Li, Hongyi,Xie, Yahong,Zhang, Huimin,&Kong, Wenwen.(2014).Epitaxial growth of Mn-Co-Ni-O thin films and thickness effects on the electrical properties.Materials Letters,130(9),127-130.
MLA Ji, Guang,et al."Epitaxial growth of Mn-Co-Ni-O thin films and thickness effects on the electrical properties".Materials Letters 130.9(2014):127-130.
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