Pure BiFeO3 and Ni-doped BiFeO3 thin films were fabricated on indium tin oxide (ITO)/glass substrates by sol-gel process. XRD analysis indicated that the pure BiFeO3 and Ni-doped BiFeO3 thin films presented single rhombohedral and tetragonal structure with different space symmetry. The (012) diffraction peak became weak and broaden with Ni doped, which indicated the grains size became small were confirmed by atom force microscope (AFM). The dielectric constant increased and leakage current decreased with Ni doped. Ferroelectric tester and vibrating sample magnetometer (VSM) showed the room-temperature ferroelectricity and ferromagnetism was enhanced with Ni doped.