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题名:
Structural evolution and electric properties of low content Zr-doped BiFeO<inf>3</inf> thin films
作者: LiJin ; WangLei ; BianLiang ; ZhaoPeng Jun ; XuJin Bao
会议名称: 3rd International Conference on Chemical Engineering and Advanced Materials, CEAM 2013
会议日期: July 6, 2013 - July 7, 2013
出版日期: 2013
会议地点: Guangzhou, China
出版地: Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland
收录类别: EI
ISSN: 10226680
ISBN: 9783037858141
部门归属: (1) Key Laboratory of Functional Materials and Devices for Special Environments, Chinese Academy of Sciences, Urumqi 830011, Xinjiang, China
摘要: The pure and Zr-doped BiFeO3 thin films were fabricated on Pt/TiO2/SiO2/Si substrates by sol-gel method. The microstructural characterization revealed a phase structural transition from rhombohedral structure to tetragonal structure in Zr-doped BiFeO3 thin films. Compared with pureBiFeO3 thin film, the Zr-doped BiFeO3 thin films showed better dielectric and leakage current characteristics. The mechanism associated with the enhancement of the electrical properties of the thin films is also discussed.
语种: 英语
内容类型: 会议论文
URI标识: http://ir.xjipc.cas.cn/handle/365002/3650
Appears in Collections:材料物理与化学研究室_会议论文

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Recommended Citation:
LiJin,WangLei,BianLiang,et al. Structural evolution and electric properties of low content Zr-doped BiFeO<inf>3</inf> thin films[C]. 见:3rd International Conference on Chemical Engineering and Advanced Materials, CEAM 2013. Guangzhou, China. July 6, 2013 - July 7, 2013.
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