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Structural evolution and electric properties of low content Zr-doped BiFeO3 thin films
LiJin; WangLei; BianLiang; ZhaoPeng Jun; XuJin Bao
2013
会议名称3rd International Conference on Chemical Engineering and Advanced Materials, CEAM 2013
页码817-820
会议日期July 6, 2013 - July 7, 2013
会议地点Guangzhou, PEOPLES R CHINA
出版地Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland
摘要

The pure and Zr-doped BiFeO3 thin films were fabricated on Pt/TiO2/SiO2/Si substrates by sol-gel method. The microstructural characterization revealed a phase structural transition from rhombohedral structure to tetragonal structure in Zr-doped BiFeO3 thin films. Compared with pureBiFeO(3) thin film, the Zr-doped BiFeO3 thin films showed better dielectric and leakage current characteristics. The mechanism associated with the enhancement of the electrical properties of the thin films is also discussed.

收录类别EI
文献类型会议论文
条目标识符http://ir.xjipc.cas.cn/handle/365002/3650
专题材料物理与化学研究室
作者单位Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Xinjiang, Peoples R China;Xinjiang Key Lab Elect Informat Mat & Devices, Xinjiang 830011, Peoples R China;Univ Chinese Acad Sci, Beijing 100049, Peoples R China
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GB/T 7714
LiJin,WangLei,BianLiang,et al. Structural evolution and electric properties of low content Zr-doped BiFeO3 thin films[C]. Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland,2013:817-820.
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