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Preparation and electrical properties of mn-co-ni-o thin-film for ntc thermistors application
ChenXueying; WangLei; XuJinbao; Bian Liang; Gao Bo
2013
Conference NameChinese Materials Congress 2012, CMC 2012
Pages599-604
Conference DateJuly 13, 2012 - July 18, 2012
Conference PlaceTaiyuan, China
Publication PlaceTrans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland
Abstract

Mn-Co-Ni-O (Mn:Co:Ni=1.74:0.72:0.54, MCN) thin films with single cubic spinel structure were prepared on Si substrates by metal organic solution deposition (MOSD) method at different annealing temperatures. The effects of annealing temperature on the phase component, crystalline microstructure, surface morphology and electrical properties of the MCN thin films were studied. According to the results of x-ray diffraction pattern, the MCN thin film annealed at 650°C had spinel structure. Observation with field emission scanning electron microscope (FE-SEM) on the MCN thin films showed that the grain size increased with increasing annealing temperature. The resistance measured at room-temperature was 18.143, 12.457, 2.435 and 3.141MΩ for the MCN thin films annealed at 650, 700, 750 and 800°C respectively. The values of thermistor constant (B30/85) and activation energy (Ea) were in the range of 3260-4840K and 0.28-0.42eV, respectively.

Indexed ByEI
Document Type会议论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/3620
Collection材料物理与化学研究室
AffiliationXinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China
Recommended Citation
GB/T 7714
ChenXueying,WangLei,XuJinbao,et al. Preparation and electrical properties of mn-co-ni-o thin-film for ntc thermistors application[C]. Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland,2013:599-604.
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