XJIPC OpenIR  > 材料物理与化学研究室
Thesis Advisor任迪远 、郭旗
Degree Grantor中国科学院研究生院
Place of Conferral北京
Degree Discipline微电子学与固体电子学
KeywordSram 无损筛选 物理应力 线性回归 测试系统


Other Abstract

With the development of space navigation, exploration and satellite technique, more and more devices are widely used in the space system. The risks brought by radiation effect associated with equipments must be considered in the application of VLSI. Therefore, screening devices with good performance of irradiation resistance from advanced commercial VLSI is important, which is also of great significance for the future development of radiation hardened electronics and aerospace in our country. The core of the dissertation is nondestructive screening of VLSI SRAM. The software and hardware used in the online test system are designed and developed in order to obtain the parameters of radiation properties of the group devices. The effect of total dose was discussed of SRAM’s standby power current and error count. According to the experiment result, the standby power current and error count are increased with total dose accumulation. The increased scale of SRAM’s Standby power current and error count was not relationship. But if the devices have error counts, their standby current was large then those have not error count. Physical stress is imposed to activate the defects that are neutral in normal state in the semiconductor devices, while Hp82000 is used to get the radiation-sensitive inherent information parameters. Mathematical statistical methods are used to select the radiation-sensitive parameters and do the regression analysis the prediction. According to the result of data we find temperature impact and pre-radiation are better then others. They supply the methods of improve the forecast precision.

Document Type学位论文
Recommended Citation
GB/T 7714
于跃. 静态随机存储器抗总剂量辐射性能无损筛选方法研究[D]. 北京. 中国科学院研究生院,2009.
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