Subject Area辐射物理与技术
电离辐射对CMOS器件损伤等效性的研究
周光文; 魏锡智; 何承发
Subtype新疆维吾尔自治区科技进步奖;
Award Level三等奖
1995
Funding Project中国科学院新疆理化技术研究所
Contribution Rank中国科学院新疆理化技术研究所
Document Type成果
Identifierhttp://ir.xjipc.cas.cn/handle/365002/2983
Collection中国科学院新疆理化技术研究所(2002年以前数据)
材料物理与化学研究室
Recommended Citation
GB/T 7714
周光文,魏锡智,何承发. 电离辐射对CMOS器件损伤等效性的研究. 新疆维吾尔自治区科技进步奖;. 1995.
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