Subject Area辐射物理与技术
星用抗高电离总剂量器件和电路系统辐射损伤机理研究
严荣良; 任迪远; 张国强; 陆妩; 高剑侠; 郭旗; 余学峰; 范隆; 赵元富; 胡浴红; 高文钰
Subtype中国科学院科技进步奖;
Award Level三等奖
1995
Funding Project中国科学院新疆理化技术研究所
Contribution Rank中国科学院新疆理化技术研究所
Document Type成果
Identifierhttp://ir.xjipc.cas.cn/handle/365002/2952
Collection中国科学院新疆理化技术研究所(2002年以前数据)
材料物理与化学研究室
Recommended Citation
GB/T 7714
严荣良,任迪远,张国强,等. 星用抗高电离总剂量器件和电路系统辐射损伤机理研究. 中国科学院科技进步奖;. 1995.
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