In this work, sol gel-derived Pb0.97La0.02(Zr0.97Ti0.03)o(3)(PLZT 2/97/3) antiferroelectric (AFE) thick films were fabricated on LaNiO3-bottom electrodes through a two-step heat-treatment process. The effects of the heat-treatment process on the crystalline structure and the energy-storage performance of the AFE films were investigated in detail. While all the PLZT 2/97/3films crystallized into a pure perovskite phase, the film pyrolyzed at 600 degrees C shows a relatively more homogeneous surface morphology. As a result, the film pyrolyzed at 600 degrees C possesses the highest energy-storage efficiency of 64.4%. However, the film pyrolyzed at a lower temperature exhibits a larger energy storage density because of its large saturated polarization. The maximum energy storage density of 20.1 J/cm(3) was obtained at 1158 kV/cm for the films pyrolyzed at 550 degrees C. (C) 2012 Elsevier Ltd and Techna Group S.r.l. All rights reserved.