XJIPC OpenIR  > 材料物理与化学研究室
Hot-carrier injection induced interface states in MOS structure and their annealing characteristics
Yu Xuefeng; Ai Erken; Ren Diyuan; Guo Qi; Zhang Guoqiang; Lu Wu
2006
Source PublicationNuclear Techniques
ISSN0253-3219
Volume29Issue:1Pages:19-21
Abstract

By hot-carrier injecting and room temperature annealing repeatedly, responses of the MOS structure to the hot-carrier injection and annealing characteristics have been studied using the technique of c-v analyses. The mechanism of hot-carrier injection induced damage in the MOS structure has also been investigated in view of generation and annealing of the interface states.

Indexed ByEI
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/2081
Collection材料物理与化学研究室
AffiliationXinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China
Recommended Citation
GB/T 7714
Yu Xuefeng,Ai Erken,Ren Diyuan,et al. Hot-carrier injection induced interface states in MOS structure and their annealing characteristics[J]. Nuclear Techniques,2006,29(1):19-21.
APA Yu Xuefeng,Ai Erken,Ren Diyuan,Guo Qi,Zhang Guoqiang,&Lu Wu.(2006).Hot-carrier injection induced interface states in MOS structure and their annealing characteristics.Nuclear Techniques,29(1),19-21.
MLA Yu Xuefeng,et al."Hot-carrier injection induced interface states in MOS structure and their annealing characteristics".Nuclear Techniques 29.1(2006):19-21.
Files in This Item:
File Name/Size DocType Version Access License
hot-carrier injectio(139KB)期刊论文作者接受稿开放获取CC BY-NC-SAView Application Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Yu Xuefeng]'s Articles
[Ai Erken]'s Articles
[Ren Diyuan]'s Articles
Baidu academic
Similar articles in Baidu academic
[Yu Xuefeng]'s Articles
[Ai Erken]'s Articles
[Ren Diyuan]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Yu Xuefeng]'s Articles
[Ai Erken]'s Articles
[Ren Diyuan]'s Articles
Terms of Use
No data!
Social Bookmark/Share
File name: hot-carrier injection induced interface states in mos structure and their annealing characteristics.pdf
Format: Adobe PDF
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.