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12位双极数模转换器高低剂量率的辐射效应
Alternative Titleradiation effects of a 12-bit bipolar digital-to-analog converter under different dose rates
王义元; 陆妩; 任迪远; 郑玉展; 高博; 李鹏伟; 于跃
2008
Source Publication核技术
ISSN0253-3219
Volume31Issue:9Pages:685-688
Abstract

通过对12位双极数模转换器在60Co γ射线的高低剂量率的辐照实验和室温退火实验的对比分析,发现数模混合电路在不同剂量率辐照下的电离辐照响应有很大差异.这种混合电路不但表现出明显的低剂量率损伤增强效应,而且表现出时间相关效应.结合辐射响应测试过程和空间电荷模型,对其损伤模块和辐射损伤机理进行初步探讨.

Other Abstract

Total-dose effects and room-temperature annealing behavior of bipolar digital-to-analog converter (DAC) irradiated by 60Co γ-rays were investigated. The results show that the response of the DAC is different between low-and high-dose-rate irradiation. It was found that the integrated circuits exhibit ELDRS and time dependence effect as well. Based on the space charge model, possible mechanism for this response is discussed.

Keyword数模转换器 辐射效应 室温退火 Eldrs
Indexed ByCSCD
CSCD IDCSCD:3394637
Citation statistics
Cited Times:2[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/2033
Collection材料物理与化学研究室
Affiliation中国科学院新疆理化技术研究所;中国科学院研究生院
Recommended Citation
GB/T 7714
王义元,陆妩,任迪远,等. 12位双极数模转换器高低剂量率的辐射效应[J]. 核技术,2008,31(9):685-688.
APA 王义元.,陆妩.,任迪远.,郑玉展.,高博.,...&于跃.(2008).12位双极数模转换器高低剂量率的辐射效应.核技术,31(9),685-688.
MLA 王义元,et al."12位双极数模转换器高低剂量率的辐射效应".核技术 31.9(2008):685-688.
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