XJIPC OpenIR  > 材料物理与化学研究室
总剂量辐照前后CMOS器件阈电压变化的统计分析
Alternative Titlestatistical analysis of threshold voltage changes of cmos devices before and after total dose irradiation
李爱武; 余学峰; 任迪远; 汪东; 匡治兵; 刘刚
2006
Source Publication核技术
ISSN0253-3219
Volume29Issue:9Pages:665-669
Abstract

本文采用统计分析的方法对大样本互补型金属-氧化物-半导体器件(CMOS)CC4069电路辐照前后的数据进行了处理。比较了研究变量的晶体管阈电压值在辐照前和累积一定辐照剂量后的标准差及统计分布,研究了样品阈电压漂移值的分布规律,由此对应用于航天系统的电子元器件进行有关辐射可靠性筛选的必要性进行了探讨。

Other Abstract

The statistical method has been applied to analyze the data of a large number samples of CMOS CC4069 circuits before and after irradiation. The standard deviation and statistical distribution of the threshold voltage of the transistors before and after irradiation were compared, and the distribution characteristics of the threshold voltage shift of the samples were studied. Furthermore, the necessity of selecting electronic devices, used in spaceflight systems to ensure their reliability, is discussed.

Keyword互补型金属-氧化物-半导体(Cmos)器件 总剂量辐照 阈电压 统计
Indexed ByCSCD
CSCD IDCSCD:0253-3219
Citation statistics
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/1945
Collection材料物理与化学研究室
Affiliation中国科学院新疆理化技术研究所;中国科学院研究生院
Recommended Citation
GB/T 7714
李爱武,余学峰,任迪远,等. 总剂量辐照前后CMOS器件阈电压变化的统计分析[J]. 核技术,2006,29(9):665-669.
APA 李爱武,余学峰,任迪远,汪东,匡治兵,&刘刚.(2006).总剂量辐照前后CMOS器件阈电压变化的统计分析.核技术,29(9),665-669.
MLA 李爱武,et al."总剂量辐照前后CMOS器件阈电压变化的统计分析".核技术 29.9(2006):665-669.
Files in This Item:
File Name/Size DocType Version Access License
总剂量辐照前后CMOS器件阈电压变化的统(698KB)期刊论文作者接受稿开放获取CC BY-NC-SAView Application Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[李爱武]'s Articles
[余学峰]'s Articles
[任迪远]'s Articles
Baidu academic
Similar articles in Baidu academic
[李爱武]'s Articles
[余学峰]'s Articles
[任迪远]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[李爱武]'s Articles
[余学峰]'s Articles
[任迪远]'s Articles
Terms of Use
No data!
Social Bookmark/Share
File name: 总剂量辐照前后CMOS器件阈电压变化的统计分析.pdf
Format: Adobe PDF
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.