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| the compare of total-dose irradiation effects between cmos 4000 and 54hc devices.pdf（370KB） | 期刊论文 | 作者接受稿 | 开放获取 | | View
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作者单位: | Xinjiang Technical Institute of Physics and Chemistry, Urumqi 830011, China
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Wang Gaili,Yu Xuefeng,Ren Diyuan,et al. Compare of total-dose irradiation effects between CMOS 4000 and 54HC devices[J]. He Jishu/Nuclear Techniques,2008-01-01,31(5):348-351.
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