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双极运算放大器辐射损伤的时间相关性
Alternative Titletime dependence of radiation damage in bipolar operational amplifiers
高嵩; 陆妩; 任迪远; 牛振红; 刘刚
2006
Source Publication半导体学报
ISSN0253-4177
Volume27Issue:7Pages:1280-1284
Abstract

通过一系列辐照实验对双极运放辐射损伤的时间相关性进行了研究.结果表明,双极运放的辐射损伤与时间有着密切的关系,通过调整辐照剂量率、退火温度及时间等参数进行循环辐照-退火实验,可以测评出器件的低剂量率辐射损伤情况,并从界面态角度对这种损伤机理进行了分析.;通过一系列辐照实验对双极运放辐射损伤的时间相关性进行了研究.结果表明,双极运放的辐射损伤与时间有着密切的关系,通过调整辐照剂量率、退火温度及时间等参数进行循环辐照-退火实验,可以测评出器件的低剂量率辐射损伤情况,并从界面态角度对这种损伤机理进行了分析.

Other Abstract

The time dependence of radiation damage in bipolar op-amps is studied through a series of radiation experiments. The results show that radiation damage in bipolar op-amps is closely related to time, and we can evaluate low-dose rate radiation damage in devices by adjusting radiating the dose rate, annealing temperature, and annealing time parameters to experiment on circulating radiation-anneal. From the interface states point of view, the possible mechanisms of radiation damage are also analyzed.

Keyword双极运算放大器 辐射损伤 时间相关性 低剂量率 加速评估
Indexed ByCSCD
CSCD IDCSCD:2551457
Citation statistics
Cited Times:2[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.xjipc.cas.cn/handle/365002/1919
Collection材料物理与化学研究室
Affiliation1.中国科学院新疆理化技术研究所
2.中国科学院研究生院
Recommended Citation
GB/T 7714
高嵩,陆妩,任迪远,等. 双极运算放大器辐射损伤的时间相关性[J]. 半导体学报,2006,27(7):1280-1284.
APA 高嵩,陆妩,任迪远,牛振红,&刘刚.(2006).双极运算放大器辐射损伤的时间相关性.半导体学报,27(7),1280-1284.
MLA 高嵩,et al."双极运算放大器辐射损伤的时间相关性".半导体学报 27.7(2006):1280-1284.
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